Inventor
NOMAGUCHI TSUNENORI
JP27 patents
⚠️ This page may combine multiple inventors who share the name “NOMAGUCHI TSUNENORI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
25 patentsUS11067391B2Jul 20, 2021
Charged particle beam device and sample thickness measurement method
HITACHI HIGH TECH CORP3 citations73
US9761409B2Sep 12, 2017
Composite charged particle detector, charged particle beam device, and charged particle detector
HITACHI HIGH TECH CORP5 citations72
US12119202B2Oct 15, 2024
Mechanism for adjusting angle of incidence on charged particle beam aperture, and charged particle beam device
HITACHI HIGH TECH CORP2 citations70
US11268915B2Mar 8, 2022
Charged particle beam device, method for processing sample, and observation method
HITACHI HIGH TECH CORP2 citations70
US11335532B2May 17, 2022
Charged particle beam device
HITACHI HIGH TECH CORP2 citations69
US11264201B2Mar 1, 2022
Charged particle beam device
HITACHI HIGH TECH CORP3 citations67
US12176180B2Dec 24, 2024
Method for producing lamella, analysis system and method for analyzing sample
HITACHI HIGH TECH CORP0 citations62
US11784022B2Oct 10, 2023
Electron beam apparatus
HITACHI HIGH TECH CORP0 citations62
US11143606B2Oct 12, 2021
Particle measuring device and particle measuring method
HITACHI HIGH TECH CORP0 citations62
US10886101B2Jan 5, 2021
Charged particle beam device
HITACHI HIGH TECH CORP1 citations62
US12586751B2Mar 24, 2026
Transfer device and analysis system
HITACHI HIGH TECH CORP0 citations61
US11183359B2Nov 23, 2021
Charged particle beam apparatus
HITACHI HIGH TECH CORP0 citations60
US11107656B2Aug 31, 2021
Charged particle beam device
HITACHI HIGH TECH CORP0 citations60
US11817289B2Nov 14, 2023
Charged particle beam device
HITACHI HIGH TECH CORP0 citations59
US11798776B2Oct 24, 2023
Charged particle beam apparatus
HITACHI HIGH TECH CORP0 citations59
US10128081B2Nov 13, 2018
Composite charged particle beam detector, charged particle beam device, and charged particle beam detector
HITACHI HIGH TECH CORP0 citations51
US9966218B2May 8, 2018
Electron beam device
HITACHI HIGH TECH CORP0 citations51
US9478389B2Oct 25, 2016
Scanning electron microscope
HITACHI HIGH TECH CORP0 citations51
US9355814B2May 31, 2016
Charged particle beam apparatus
HITACHI HIGH TECH CORP0 citations51
US11640897B2May 2, 2023
Charged particle beam device
HITACHI HIGH TECH CORP0 citations50
US11430630B2Aug 30, 2022
Charged particle beam apparatus
HITACHI HIGH TECH CORP0 citations50
US11164716B2Nov 2, 2021
Charged particle beam device
HITACHI HIGH TECH CORP0 citations48
US12436114B2Oct 7, 2025
Semiconductor analysis system
HITACHI HIGH TECH CORP0 citations46
US12347707B2Jul 1, 2025
Semiconductor analysis system
HITACHI HIGH TECH CORP0 citations46
US12374520B2Jul 29, 2025
Tweezers, conveyance device, and method for conveying sample piece
HITACHI HIGH TECH CORP0 citations45