Inventor
KATANE JUNICHI
JP22 patents
⚠️ This page may combine multiple inventors who share the name “KATANE JUNICHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
17 patentsUS7755045B2Jul 13, 2010
Scanning electron microscope
HITACHI HIGH TECH CORP14 citations83
US8026491B2Sep 27, 2011
Charged particle beam apparatus and method for charged particle beam adjustment
HITACHI HIGH TECH CORP9 citations80
US11170972B2Nov 9, 2021
Scanning electron microscope and method for analyzing secondary electron spin polarization
HITACHI HIGH TECH CORP2 citations71
US10886101B2Jan 5, 2021
Charged particle beam device
HITACHI HIGH TECH CORP1 citations62
US8692195B2Apr 8, 2014
Charged particle radiation device
HITACHI HIGH TECH CORP2 citations62
US12431325B2Sep 30, 2025
Sample image observation device and method for same
HITACHI HIGH TECH CORP0 citations61
US12400827B2Aug 26, 2025
Charged particle beam device
HITACHI HIGH TECH CORP0 citations61
US11823861B2Nov 21, 2023
Charged particle beam device
HITACHI HIGH TECH CORP0 citations61
US11756763B2Sep 12, 2023
Scanning electron microscope
HITACHI HIGH TECH CORP0 citations61
US12437958B2Oct 7, 2025
Electron beam application device
HITACHI HIGH TECH CORP0 citations52
US11961699B2Apr 16, 2024
Charged particle beam device
HITACHI HIGH TECH CORP0 citations51
US9824854B2Nov 21, 2017
Charged particle beam device, image generation method, observation system
HITACHI HIGH TECH CORP0 citations51
US7557346B2Jul 7, 2009
Scanning electron microscope
HITACHI HIGH TECH CORP0 citations51
US12217928B2Feb 4, 2025
Electron gun and electron microscope
HITACHI HIGH TECH CORP0 citations50
US12165828B2Dec 10, 2024
Electron gun and electron beam application apparatus
HITACHI HIGH TECH CORP0 citations50
US11640897B2May 2, 2023
Charged particle beam device
HITACHI HIGH TECH CORP0 citations50
US11430630B2Aug 30, 2022
Charged particle beam apparatus
HITACHI HIGH TECH CORP0 citations50