P

Inventor

LIVENGOOD RICHARD H

US28 patents

Patents

28 patents
US6448168B1Sep 10, 2002

Method for distributing a clock on the silicon backside of an integrated circuit

INTEL CORP382 citations99
US6222246B1Apr 24, 2001

Flip-chip having an on-chip decoupling capacitor

INTEL CORP106 citations98
US6037822AMar 14, 2000

Method and apparatus for distributing a clock on the silicon backside of an integrated circuit

INTEL CORP71 citations96
US6825557B2Nov 30, 2004

Localized backside chip cooling with integrated smart valves

INTEL CORP62 citations95
US6495454B2Dec 17, 2002

Substrate interconnect for power distribution on integrated circuits

INTEL CORP66 citations94
US6355950B1Mar 12, 2002

Substrate interconnect for power distribution on integrated circuits

INTEL CORP47 citations94
US5952247ASep 14, 1999

Method of accessing the circuitry on a semiconductor substrate from the bottom of the semiconductor substrate

INTEL CORP34 citations93
US5948217ASep 7, 1999

Method and apparatus for endpointing while milling an integrated circuit

INTEL CORP45 citations93
US5942805AAug 24, 1999

Fiducial for aligning an integrated circuit die

INTEL CORP40 citations93
US5805421ASep 8, 1998

Semiconductor substrate having alignment marks for locating circuitry on the substrate

INTEL CORP30 citations93
US6355494B1Mar 12, 2002

Method and apparatus for controlling material removal from a semiconductor substrate using induced current endpointing

INTEL CORP27 citations92
US6316981B1Nov 13, 2001

Signal distribution network on backside of substrate

INTEL CORP23 citations92
US6020746AFeb 1, 2000

Method and apparatus for probing an integrated circuit through the back side of an integrated circuit die

INTEL CORP21 citations92
US5976980ANov 2, 1999

Method and apparatus providing a mechanical probe structure in an integrated circuit die

INTEL CORP20 citations92
US5904486AMay 18, 1999

Method for performing a circuit edit through the back side of an integrated circuit die

INTEL CORP17 citations92
US6525922B2Feb 25, 2003

High performance via capacitor and method for manufacturing same

INTEL CORP9 citations74
US6309897B1Oct 30, 2001

Method and apparatus providing a circuit edit structure through the back side of an integrated circuit die

INTEL CORP10 citations74
US6159753ADec 12, 2000

Method and apparatus for editing an integrated circuit

INTEL CORP9 citations74
US6153891ANov 28, 2000

Method and apparatus providing a circuit edit structure through the back side of an integrated circuit die

INTEL CORP10 citations74
US6150718ANov 21, 2000

Method and apparatus for performing a circuit edit through the back side of an integrated circuit die

INTEL CORP12 citations74
US6122174ASep 19, 2000

Method of accessing the circuitry on a semiconductor substrate from the bottom of the semiconductor substrate

INTEL CORP6 citations74
US6001703ADec 14, 1999

Method of forming a fiducial for aligning an integrated circuit die

INTEL CORP12 citations74
US7232526B2Jun 19, 2007

Method and apparatus for controlling material removal from semiconductor substrate using induced current endpointing

INTEL CORP4 citations73
US6579732B2Jun 17, 2003

Method and apparatus for controlling material removal from a semiconductor substrate using induced current endpointing

INTEL CORP5 citations73
US7205566B2Apr 17, 2007

Transistor-level signal cutting method and structure

INTEL CORP2 citations61
US7141439B2Nov 28, 2006

Transistor-level signal cutting method and structure

INTEL CORP0 citations51
US6780658B2Aug 24, 2004

Method and apparatus for controlling material removal from a semiconductor substrate using induced current endpointing

INTEL CORP0 citations51
US7183122B2Feb 27, 2007

Physical nano-machining with a scanning probe system for integrated circuit modification

INTEL CORP0 citations42