Inventor
KOEPPE SIEGMAR
DE27 patents
⚠️ This page may combine multiple inventors who share the name “KOEPPE SIEGMAR”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INFINEON TECHNOLOGIES AG
14 patentsUS7755110B2Jul 13, 2010
Architecture of function blocks and wirings in a structured ASIC and configurable driver cell of a logic cell zone
INFINEON TECHNOLOGIES AG136 citations96
US7492187B2Feb 17, 2009
Circuit arrangement for supplying configuration data in FPGA devices
INFINEON TECHNOLOGIES AG28 citations92
US7688126B2Mar 30, 2010
Time delay circuit and time to digital converter
INFINEON TECHNOLOGIES AG18 citations91
US7564284B2Jul 21, 2009
Time delay circuit and time to digital converter
INFINEON TECHNOLOGIES AG41 citations91
US6661701B2Dec 9, 2003
Three-transistor DRAM cell and associated fabrication method
INFINEON TECHNOLOGIES AG8 citations73
US7177385B2Feb 13, 2007
Shift register for safely providing a configuration bit
INFINEON TECHNOLOGIES AG7 citations72
US7696829B2Apr 13, 2010
Frequency synthesizer and method
INFINEON TECHNOLOGIES AG4 citations63
US7656204B2Feb 2, 2010
Divider circuit
INFINEON TECHNOLOGIES AG5 citations63
US6978290B2Dec 20, 2005
Carry ripple adder
INFINEON TECHNOLOGIES AG2 citations59
US7386776B2Jun 10, 2008
System for testing digital components
INFINEON TECHNOLOGIES AG4 citations57
US7158396B2Jan 2, 2007
CAM (content addressable memory) apparatus
INFINEON TECHNOLOGIES AG2 citations57
US7439765B2Oct 21, 2008
Mask-programmable logic macro and method for programming a logic macro
INFINEON TECHNOLOGIES AG0 citations51
US8780648B2Jul 15, 2014
Latch based memory device
INFINEON TECHNOLOGIES AG1 citations49
US7509561B2Mar 24, 2009
Parity checking circuit for continuous checking of the parity of a memory cell
INFINEON TECHNOLOGIES AG0 citations41
SIEMENS AG
6 patentsUS5930596AJul 27, 1999
Semiconductor component for vertical integration and manufacturing method
SIEMENS AG54 citations96
US4799096AJan 17, 1989
Monolithic integrated circuit comprising circuit branches parallel to one another
SIEMENS AG49 citations92
US5969534AOct 19, 1999
Semiconductor testing apparatus
SIEMENS AG13 citations74
US4868825ASep 19, 1989
Method for simulating an open fault in a logic circuit comprising field effect transistors and simulation models for implementing the method
SIEMENS AG14 citations74
US4852093AJul 25, 1989
Method for simulating a fault in a logic circuit and a simulation model for the implementation of the method
SIEMENS AG20 citations74
US5610531AMar 11, 1997
Testing method for semiconductor circuit levels
SIEMENS AG0 citations42