Inventor
TURNQUIST JAMES ALAN
US12 patents
Patents
12 patentsUS6678643B1Jan 13, 2004
Event based semiconductor test system
ADVANTEST CORP55 citations96
US6532561B1Mar 11, 2003
Event based semiconductor test system
ADVANTEST CORP62 citations96
US6557128B1Apr 29, 2003
Semiconductor test system supporting multiple virtual logic testers
ADVANTEST CORP71 citations95
US6567941B1May 20, 2003
Event based test system storing pin calibration data in non-volatile memory
ADVANTEST CORP43 citations92
US6404218B1Jun 11, 2002
Multiple end of test signal for event based test system
ADVANTEST CORP24 citations92
US6377065B1Apr 23, 2002
Glitch detection for semiconductor test system
ADVANTEST CORP50 citations92
US6360343B1Mar 19, 2002
Delta time event based test system
ADVANTEST CORP27 citations92
US6226765B1May 1, 2001
Event based test system data memory compression
ADVANTEST CORP27 citations92
US5883906AMar 16, 1999
Pattern data compression and decompression for semiconductor test system
ADVANTEST CORP64 citations91
US6578169B1Jun 10, 2003
Data failure memory compaction for semiconductor test system
ADVANTEST CORP19 citations84
US7089135B2Aug 8, 2006
Event based IC test system
ADVANTEST CORP15 citations82
US6668331B1Dec 23, 2003
Apparatus and method for successively generating an event to establish a total delay time that is greater than can be expressed by specified data bits in an event memory
ADVANTEST CORP11 citations69