Inventor
BUTLER KENNETH M
US8 patents
⚠️ This page may combine multiple inventors who share the name “BUTLER KENNETH M”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TEXAS INSTRUMENTS INC
7 patentsUS5694402ADec 2, 1997
System and method for structurally testing integrated circuit devices
TEXAS INSTRUMENTS INC94 citations95
US8344749B2Jan 1, 2013
Through carrier dual side loop-back testing of TSV die after die attach to substrate
TEXAS INSTRUMENTS INC23 citations88
US8051398B2Nov 1, 2011
Test method and system for characterizing and/or refining an IC design cycle
TEXAS INSTRUMENTS INC7 citations81
US7129735B2Oct 31, 2006
Method for test data-driven statistical detection of outlier semiconductor devices
TEXAS INSTRUMENTS INC12 citations77
US6697982B2Feb 24, 2004
Generating netlist test vectors by stripping references to a pseudo input
TEXAS INSTRUMENTS INC8 citations70
US7865849B2Jan 4, 2011
System and method for estimating test escapes in integrated circuits
TEXAS INSTRUMENTS INC2 citations56
US7203880B2Apr 10, 2007
Generating an abbreviated netlist including pseudopin inputs and output nodes
TEXAS INSTRUMENTS INC0 citations48