Inventor
CHEN KUEI-PAO
TW14 patents
⚠️ This page may combine multiple inventors who share the name “CHEN KUEI-PAO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
YOUNGTEK ELECTRONICS CORP
8 patentsUS8031930B2Oct 4, 2011
Testing system and testing method for inspecting electonic devices
YOUNGTEK ELECTRONICS CORP64 citations95
US7329028B2Feb 12, 2008
Uniform light generating system for adjusting output brightness and method of using the same
YOUNGTEK ELECTRONICS CORP2 citations62
US7379171B2May 27, 2008
Optical object distance simulation device
YOUNGTEK ELECTRONICS CORP2 citations57
US9029725B2May 12, 2015
Packaged chip detection and classification device
YOUNGTEK ELECTRONICS CORP0 citations51
US7256603B1Aug 14, 2007
Apparatus for measuring the static parameters of integrated circuits
YOUNGTEK ELECTRONICS CORP1 citations51
US7898663B2Mar 1, 2011
Uniform light generating system for testing an image-sensing device and method of using the same
YOUNGTEK ELECTRONICS CORP0 citations41
US7800841B2Sep 21, 2010
Optical object distance simulation device for reducing total optical path
YOUNGTEK ELECTRONICS CORP0 citations40
US7163829B2Jan 16, 2007
Method of integration testing for packaged electronic components
YOUNGTEK ELECTRONICS CORP0 citations32
WANG BILY
6 patentsUS8710387B2Apr 29, 2014
LED package chip classification system
WANG BILY3 citations62
US8686310B2Apr 1, 2014
Packaged chip detection and classification device
WANG BILY2 citations62
US8519458B2Aug 27, 2013
Light-emitting element detection and classification device
WANG BILY4 citations62
US8873920B2Oct 28, 2014
Light-guiding cover structure
WANG BILY2 citations57
US8107720B2Jan 31, 2012
Detection system for detecting appearances of many electronic elements and methods of using the same
WANG BILY1 citations47
US8525524B2Sep 3, 2013
Multi-track detection system for detecting the appearance of electronic elements
WANG BILY0 citations37