Inventor
CHEN HSIN-CHENG
TW32 patents
⚠️ This page may combine multiple inventors who share the name “CHEN HSIN-CHENG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
10 patentsUS10867669B2Dec 15, 2020
Serialized SRAM access to reduce congestion
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US9858989B1Jan 2, 2018
Serialized SRAM access to reduce congestion
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US10776538B2Sep 15, 2020
Function safety and fault management modeling at electrical system level (ESL)
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US12204825B2Jan 21, 2025
Function safety and fault management modeling at electrical system level (ESL)
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11354465B2Jun 7, 2022
Function safety and fault management modeling at electrical system level (ESL)
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11694732B2Jul 4, 2023
Active random access memory
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US11322185B2May 3, 2022
Active random access memory
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US10720206B2Jul 21, 2020
Serialized SRAM access to reduce congestion
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10431296B2Oct 1, 2019
Serialized SRAM access to reduce congestion
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10867642B2Dec 15, 2020
Active random access memory
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
WANG BILY
6 patentsUS8710387B2Apr 29, 2014
LED package chip classification system
WANG BILY3 citations62
US8686310B2Apr 1, 2014
Packaged chip detection and classification device
WANG BILY2 citations62
US8519458B2Aug 27, 2013
Light-emitting element detection and classification device
WANG BILY4 citations62
US8873920B2Oct 28, 2014
Light-guiding cover structure
WANG BILY2 citations57
US8107720B2Jan 31, 2012
Detection system for detecting appearances of many electronic elements and methods of using the same
WANG BILY1 citations47
US8525524B2Sep 3, 2013
Multi-track detection system for detecting the appearance of electronic elements
WANG BILY0 citations37
MEDIATEK INC
4 patentsUS7861141B2Dec 28, 2010
Method and device for error analysis of optical disc
MEDIATEK INC37 citations92
US7395462B2Jul 1, 2008
Defect estimation apparatus and related method
MEDIATEK INC2 citations61
US7378994B1May 27, 2008
EFM/EFM+ encoder and method thereof
MEDIATEK INC5 citations61
US7397396B2Jul 8, 2008
Modulation methods and systems
MEDIATEK INC0 citations51