P

Inventor

GUPTA SUBHASH

SG98 patents
⚠️ This page may combine multiple inventors who share the name “GUPTA SUBHASH”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

CHARTERED SEMICONDUCTOR MFG

26 patents
US6348407B1Feb 19, 2002

Method to improve adhesion of organic dielectrics in dual damascene interconnects

CHARTERED SEMICONDUCTOR MFG250 citations99
US6284657B1Sep 4, 2001

Non-metallic barrier formation for copper damascene type interconnects

CHARTERED SEMICONDUCTOR MFG190 citations99
US6683002B1Jan 27, 2004

Method to create a copper diffusion deterrent interface

CHARTERED SEMICONDUCTOR MFG71 citations98
US6380087B1Apr 30, 2002

CMP process utilizing dummy plugs in damascene process

CHARTERED SEMICONDUCTOR MFG89 citations98
US6352917B1Mar 5, 2002

Reversed damascene process for multiple level metal interconnects

CHARTERED SEMICONDUCTOR MFG140 citations98
US6274499B1Aug 14, 2001

Method to avoid copper contamination during copper etching and CMP

CHARTERED SEMICONDUCTOR MFG98 citations98
US6184138B1Feb 6, 2001

Method to create a controllable and reproducible dual copper damascene structure

CHARTERED SEMICONDUCTOR MFG121 citations98
US6114243ASep 5, 2000

Method to avoid copper contamination on the sidewall of a via or a dual damascene structure

CHARTERED SEMICONDUCTOR MFG123 citations98
US6566260B2May 20, 2003

Non-metallic barrier formations for copper damascene type interconnects

CHARTERED SEMICONDUCTOR MFG32 citations96
US6489233B2Dec 3, 2002

Non-metallic barrier formations for copper damascene type interconnects

CHARTERED SEMICONDUCTOR MFG36 citations96
US6372636B1Apr 16, 2002

Composite silicon-metal nitride barrier to prevent formation of metal fluorides in copper damascene

CHARTERED SEMICONDUCTOR MFG70 citations96
US6251786B1Jun 26, 2001

Method to create a copper dual damascene structure with less dishing and erosion

CHARTERED SEMICONDUCTOR MFG65 citations96
US6225221B1May 1, 2001

Method to deposit a copper seed layer for dual damascene interconnects

CHARTERED SEMICONDUCTOR MFG53 citations95
US6380084B1Apr 30, 2002

Method to form high performance copper damascene interconnects by de-coupling via and metal line filling

CHARTERED SEMICONDUCTOR MFG59 citations94
US6350675B1Feb 26, 2002

Integration of silicon-rich material in the self-aligned via approach of dual damascene interconnects

CHARTERED SEMICONDUCTOR MFG55 citations93
US6740580B1May 25, 2004

Method to form copper interconnects by adding an aluminum layer to the copper diffusion barrier

CHARTERED SEMICONDUCTOR MFG40 citations92
US6720204B2Apr 13, 2004

Method of using hydrogen plasma to pre-clean copper surfaces during Cu/Cu or Cu/metal bonding

CHARTERED SEMICONDUCTOR MFG38 citations92
US6531390B2Mar 11, 2003

Non-metallic barrier formations for copper damascene type interconnects

CHARTERED SEMICONDUCTOR MFG19 citations92
US6475810B1Nov 5, 2002

Method of manufacturing embedded organic stop layer for dual damascene patterning

CHARTERED SEMICONDUCTOR MFG24 citations92
US6465888B2Oct 15, 2002

Composite silicon-metal nitride barrier to prevent formation of metal fluorides in copper damascene

CHARTERED SEMICONDUCTOR MFG33 citations92
US6429117B1Aug 6, 2002

Method to create copper traps by modifying treatment on the dielectrics surface

CHARTERED SEMICONDUCTOR MFG21 citations92
US6429122B2Aug 6, 2002

Non metallic barrier formations for copper damascene type interconnects

CHARTERED SEMICONDUCTOR MFG25 citations92
US6417088B1Jul 9, 2002

Method of application of displacement reaction to form a conductive cap layer for flip-chip, COB, and micro metal bonding

CHARTERED SEMICONDUCTOR MFG44 citations92
US6394114B1May 28, 2002

Method for stripping copper in damascene interconnects

CHARTERED SEMICONDUCTOR MFG20 citations92
US6378759B1Apr 30, 2002

Method of application of conductive cap-layer in flip-chip, COB, and micro metal bonding

CHARTERED SEMICONDUCTOR MFG37 citations92
US6340608B1Jan 22, 2002

Method of fabricating copper metal bumps for flip-chip or chip-on-board IC bonding on terminating copper pads

CHARTERED SEMICONDUCTOR MFG21 citations92

ADVANCED MICRO DEVICES INC

18 patents
US5705430AJan 6, 1998

Dual damascene with a sacrificial via fill

ADVANCED MICRO DEVICES INC173 citations99
US5614765AMar 25, 1997

Self aligned via dual damascene

ADVANCED MICRO DEVICES INC172 citations99
US5795823AAug 18, 1998

Self aligned via dual damascene

ADVANCED MICRO DEVICES INC114 citations98
US5926690AJul 20, 1999

Run-to-run control process for controlling critical dimensions

ADVANCED MICRO DEVICES INC346 citations97
US5691238ANov 25, 1997

Subtractive dual damascene

ADVANCED MICRO DEVICES INC68 citations96
US5686354ANov 11, 1997

Dual damascene with a protective mask for via etching

ADVANCED MICRO DEVICES INC80 citations96
US6040619AMar 21, 2000

Semiconductor device including antireflective etch stop layer

ADVANCED MICRO DEVICES INC67 citations95
US6365320B1Apr 2, 2002

Process for forming anti-reflective film for semiconductor fabrication using extremely short wavelength deep ultraviolet photolithography

ADVANCED MICRO DEVICES INC24 citations93
US6172421B1Jan 9, 2001

Semiconductor device having an intermetallic layer on metal interconnects

ADVANCED MICRO DEVICES INC29 citations93
US5348615ASep 20, 1994

Selective planarization method using regelation

ADVANCED MICRO DEVICES INC27 citations93
US6313018B1Nov 6, 2001

Process for fabricating semiconductor device including antireflective etch stop layer

ADVANCED MICRO DEVICES INC20 citations92
US6066578AMay 23, 2000

Method and system for providing inorganic vapor surface treatment for photoresist adhesion promotion

ADVANCED MICRO DEVICES INC20 citations92
US5910453AJun 8, 1999

Deep UV anti-reflection coating etch

ADVANCED MICRO DEVICES INC77 citations92
US5841196ANov 24, 1998

Fluted via formation for superior metal step coverage

ADVANCED MICRO DEVICES INC47 citations92
US5770519AJun 23, 1998

Copper reservoir for reducing electromigration effects associated with a conductive via in a semiconductor device

ADVANCED MICRO DEVICES INC49 citations92
US5746884AMay 5, 1998

Fluted via formation for superior metal step coverage

ADVANCED MICRO DEVICES INC47 citations92
US5639691AJun 17, 1997

Copper pellet for reducing electromigration effects associated with a conductive via in a semiconductor device

ADVANCED MICRO DEVICES INC19 citations92
US4992134AFeb 12, 1991

Dopant-independent polysilicon plasma etch

ADVANCED MICRO DEVICES INC32 citations92

ANDERSEN CONSULTING

2 patents

TEXAS INSTRUMENTS INC

2 patents

GUPTA SUBHASH

1 patent

TEXAS INSTR INCORPORATE

1 patent

Showing the top 50 of 98 patents by PatentIndex Score.