Inventor

CANTWELL DERMOT

US26 patents

⚠️ This page may combine multiple inventors who share the name “CANTWELL DERMOT”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

CANTWELL DERMOT

APPLIED MATERIALS INC

Time-series fault detection, fault classification, and transition analysis using a K-nearest-neighbor and logistic regression approach

Predictive spatial digital design of experiment for advanced semiconductor process optimization and control

Prescriptive analytics in highly collinear response space

Using radial basis function networks and hyper-cubes for excursion classification in semi-conductor processing equipment

Predictive spatial digital design of experiment for advanced semiconductor process optimization and control

Adaptive control of wafer-to-wafer variability in device performance in advanced semiconductor processes

Wafer point by point analysis and data presentation

K-nearest neighbor-based method and system to provide multi-variate analysis on tool process data

Time-series fault detection, fault classification, and transition analysis using a k-nearest-neighbor and logistic regression approach

Prescriptive analytics in highly collinear response space

Fault detection classification

Adaptive control of variability in device performance in advanced semiconductor processes

Multi-level RF pulse monitoring and RF pulsing parameter optimization at a manufacturing system

Multi-level RF pulse monitoring and RF pulsing parameter optimization at a manufacturing system

Multi-level RF pulse monitoring and RF pulsing parameter optimization at a manufacturing system

Using radial basis function networks and hyper-cubes for excursion classification in semi-conductor processing equipment

Predictive modeling of a manufacturing process using a set of trained inverted models

Trend dynamic sensor imaging using contour maps to visualize multiple trend data sets in a single view

Trend dynamic sensor imaging using contour maps to visualize multiple trend data sets in a single view

CRUSE JAMES P

Methods for processing substrates in process systems having shared resources

Methods for monitoring processing equipment

Methods for processing substrates in process systems having shared resources

STRAGENT LLC

System, method and computer program product for adding voice activation and voice control to a media player

System, method and computer program product for adding voice activation and voice control to a media player

System, method and computer program product for adding voice activation and voice control to a media player

LIAN LEI

Pulsed plasma monitoring using optical sensor and a signal analyzer forming a mean waveform