Inventor
MAIE HIROMU
JP6 patents
Patents
6 patentsUS11573190B2Feb 7, 2023
Calibration method for X-ray measuring device
MITUTOYO CORP2 citations71
US11344276B2May 31, 2022
Calibration method of x-ray measuring device
MITUTOYO CORP4 citations71
US10295337B2May 21, 2019
Surface texture measuring apparatus
MITUTOYO CORP2 citations71
US11040443B2Jun 22, 2021
Rotational angle limiting mechanism
MITUTOYO CORP2 citations61
US11435560B2Sep 6, 2022
Lens substrate stacking position calculating apparatus and program
MITUTOYO CORP0 citations50
US11346660B2May 31, 2022
Calibration method of x-ray measuring device
MITUTOYO CORP0 citations50