P

Inventor

IRELAND PHILIP J

US69 patents
⚠️ This page may combine multiple inventors who share the name “IRELAND PHILIP J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MICRON TECHNOLOGY INC

46 patents
US6358862B1Mar 19, 2002

Passivation integrity improvements

MICRON TECHNOLOGY INC207 citations99
US5751012AMay 12, 1998

Polysilicon pillar diode for use in a non-volatile memory cell

MICRON TECHNOLOGY INC911 citations99
US5990021ANov 23, 1999

Integrated circuit having self-aligned CVD-tungsten/titanium contact plugs strapped with metal interconnect and method of manufacture

MICRON TECHNOLOGY INC156 citations98
US6627529B2Sep 30, 2003

Capacitance reduction by tunnel formation for use with semiconductor device

MICRON TECHNOLOGY INC38 citations96
US6348411B1Feb 19, 2002

Method of making a contact structure

MICRON TECHNOLOGY INC50 citations96
US6909128B2Jun 21, 2005

Capacitance reduction by tunnel formation for use with a semiconductor device

MICRON TECHNOLOGY INC23 citations93
US6777813B2Aug 17, 2004

Fill pattern generation for spin-on-glass and related self-planarization deposition

MICRON TECHNOLOGY INC14 citations93
US6740916B1May 25, 2004

Contact structure for integrated circuit devices

MICRON TECHNOLOGY INC17 citations93
US6686288B1Feb 3, 2004

Integrated circuit having self-aligned CVD-tungsten/titanium contact plugs strapped with metal interconnect and method of manufacture

MICRON TECHNOLOGY INC30 citations93
US6563219B2May 13, 2003

Passivation integrity improvements

MICRON TECHNOLOGY INC14 citations93
US6420257B2Jul 16, 2002

Process for forming trenches and contacts during the formation of a semiconductor memory device

MICRON TECHNOLOGY INC15 citations93
US6388284B2May 14, 2002

Capacitor structures

MICRON TECHNOLOGY INC44 citations93
US6291289B2Sep 18, 2001

Method of forming DRAM trench capacitor with metal layer over hemispherical grain polysilicon

MICRON TECHNOLOGY INC41 citations93
US6303492B1Oct 16, 2001

Expanded implantation of contact holes

MICRON TECHNOLOGY INC19 citations92
US9557376B2Jan 31, 2017

Apparatuses and methods for die seal crack detection

MICRON TECHNOLOGY INC10 citations84
US9287184B2Mar 15, 2016

Apparatuses and methods for die seal crack detection

MICRON TECHNOLOGY INC14 citations84
US7989957B2Aug 2, 2011

Self-aligned, integrated circuit contact

MICRON TECHNOLOGY INC7 citations84
US6696359B1Feb 24, 2004

Design layout method for metal lines of an integrated circuit

MICRON TECHNOLOGY INC15 citations84
US6479378B1Nov 12, 2002

Process for forming electrical interconnects in integrated circuits

MICRON TECHNOLOGY INC11 citations82
US7968403B2Jun 28, 2011

Method of fabricating a sleeve insulator for a contact structure

MICRON TECHNOLOGY INC4 citations74
US7115506B2Oct 3, 2006

Method of making a contact structure

MICRON TECHNOLOGY INC5 citations74
US6867498B2Mar 15, 2005

Metal line layout of an integrated circuit

MICRON TECHNOLOGY INC5 citations74
US6812512B2Nov 2, 2004

Integrated circuit having self-aligned CVD-tungsten/titanium contact plugs strapped with metal interconnect and method of manufacture

MICRON TECHNOLOGY INC11 citations74
US6806575B2Oct 19, 2004

Subresolution features for a semiconductor device

MICRON TECHNOLOGY INC4 citations74
US6800517B2Oct 5, 2004

Methods of forming conductive interconnects

MICRON TECHNOLOGY INC7 citations74
US6780762B2Aug 24, 2004

Self-aligned, integrated circuit contact and formation method

MICRON TECHNOLOGY INC11 citations74
US6531352B1Mar 11, 2003

Methods of forming conductive interconnects

MICRON TECHNOLOGY INC11 citations74
US6525426B2Feb 25, 2003

Subresolution features for a semiconductor device

MICRON TECHNOLOGY INC4 citations74
US6444556B2Sep 3, 2002

Chemistry for chemical vapor deposition of titanium containing films

MICRON TECHNOLOGY INC10 citations74
US6365489B1Apr 2, 2002

Creation of subresolution features via flow characteristics

MICRON TECHNOLOGY INC6 citations74
US6331379B1Dec 18, 2001

Photo-lithography process using multiple anti-reflective coatings

MICRON TECHNOLOGY INC10 citations74
US9583419B2Feb 28, 2017

Semiconductor constructions having through-substrate interconnects

MICRON TECHNOLOGY INC2 citations73
US6110789AAug 29, 2000

Contact formation using two anneal steps

MICRON TECHNOLOGY INC15 citations73
US6667531B1Dec 23, 2003

Method and apparatus for a deposited fill layer

MICRON TECHNOLOGY INC12 citations71
US7943503B2May 17, 2011

Trench interconnect structure and formation method

MICRON TECHNOLOGY INC3 citations63
US7646099B2Jan 12, 2010

Self-aligned, integrated circuit contact

MICRON TECHNOLOGY INC3 citations63
US7387866B2Jun 17, 2008

Photolithography process using multiple anti-reflective coatings

MICRON TECHNOLOGY INC3 citations63
US7352019B2Apr 1, 2008

Capacitance reduction by tunnel formation for use with a semiconductor device

MICRON TECHNOLOGY INC1 citations63
US7138719B2Nov 21, 2006

Trench interconnect structure and formation method

MICRON TECHNOLOGY INC3 citations63
US7033939B2Apr 25, 2006

Chemistry for chemical vapor deposition of titanium containing films

MICRON TECHNOLOGY INC1 citations63
US7026717B2Apr 11, 2006

Fill pattern generation for spin-on glass and related self-planarization deposition

MICRON TECHNOLOGY INC3 citations63
US6879045B2Apr 12, 2005

Integrated circuit with modified metal features and method of fabrication therefor

MICRON TECHNOLOGY INC3 citations63
US6846736B2Jan 25, 2005

Creation of subresolution features via flow characteristics

MICRON TECHNOLOGY INC3 citations63
US6806577B2Oct 19, 2004

Fill pattern generation for spin-on glass and related self-planarization deposition

MICRON TECHNOLOGY INC2 citations63
US6806576B2Oct 19, 2004

Passivation integrity improvements

MICRON TECHNOLOGY INC1 citations63
US6777330B2Aug 17, 2004

Chemistry for chemical vapor deposition of titanium containing films

MICRON TECHNOLOGY INC1 citations63

INTEL CORP

2 patents

MICRON SEMICONDUCTOR INC

1 patent

WOOD ALAN G

1 patent

Showing the top 50 of 69 patents by PatentIndex Score.