Inventor
NAKAIZUMI KAZUO
JP18 patents
⚠️ This page may combine multiple inventors who share the name “NAKAIZUMI KAZUO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NEC CORP
12 patentsUS4672583AJun 9, 1987
Dynamic random access memory device provided with test circuit for internal refresh circuit
NEC CORP86 citations96
US6133744AOct 17, 2000
Apparatus for testing semiconductor wafer
NEC CORP100 citations95
US5532610AJul 2, 1996
Apparatus for testing semicondctor wafer
NEC CORP100 citations94
US6031382AFeb 29, 2000
Functional tester for integrated circuits
NEC CORP25 citations92
US5058059AOct 15, 1991
Memory circuit having a redundant memory cell array for replacing faulty cells
NEC CORP48 citations91
US4616346AOct 7, 1986
Random access memory capable of varying a frequency in active and standby modes
NEC CORP35 citations91
US4878201AOct 31, 1989
Semiconductor memory device having an improved timing signal generator for the column selection circuit
NEC CORP22 citations82
US4688196AAug 18, 1987
Semiconductor dynamic memory device with less power consumption in internal refresh mode
NEC CORP24 citations80
US4985866AJan 15, 1991
Compound semiconductor memory device having redundant circuit configuration
NEC CORP16 citations73
US4982111AJan 1, 1991
High speed latching circuit with level shift output circuits
NEC CORP16 citations73
US4933903AJun 12, 1990
Static memory device provided with high-speed writing circuit
NEC CORP7 citations73
US4825415AApr 25, 1989
Signal input circuit having signal latch function
NEC CORP8 citations73