Inventor
OKUMOTO TOYOHARU
JP15 patents
⚠️ This page may combine multiple inventors who share the name “OKUMOTO TOYOHARU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
12 patentsUS5308977AMay 3, 1994
Plasma mass spectrometer
HITACHI LTD61 citations95
US6248998B1Jun 19, 2001
Plasma ion source mass spectrometer
HITACHI LTD39 citations92
US5793039AAug 11, 1998
Mass spectrometer, skimmer cone assembly, skimmer cone and its manufacturing method
HITACHI LTD31 citations92
US5252827AOct 12, 1993
Method and apparatus for analysis of gases using plasma
HITACHI LTD21 citations90
US5763877AJun 9, 1998
Analyzer using plasma and analysis method using plasma, interface used for the same and sample introducing component used for the same
HITACHI LTD7 citations73
US5616918AApr 1, 1997
Plasma ion mass spectrometer and plasma mass spectrometry using the same
HITACHI LTD14 citations73
US5202562AApr 13, 1993
High sensitive element analyzing method and apparatus of the same
HITACHI LTD16 citations73
US5108178AApr 28, 1992
Atomic absorption spectrophotometer and electromagnetic shut-off valve for use therein
HITACHI LTD6 citations73
US4867562ASep 19, 1989
Atomic absorption spectrophotometer
HITACHI LTD10 citations73
US5104220AApr 14, 1992
Atomic absorption spectrophotometer and analyzing method
HITACHI LTD9 citations72
US4890919AJan 2, 1990
Atomic absorption spectrophotometer
HITACHI LTD4 citations62
US4840484AJun 20, 1989
Atomic absorption spectrophotometer with furnace at pressure equal or near light source pressure
HITACHI LTD6 citations62
HITACHI HIGH TECH CORP
3 patentsUS7161141B2Jan 9, 2007
Ion trap/time-of-flight mass spectrometer and method of measuring ion accurate mass
HITACHI HIGH TECH CORP15 citations84
US7186973B2Mar 6, 2007
Ion trap/time-of-flight mass analyzing apparatus and mass analyzing method
HITACHI HIGH TECH CORP11 citations83
US6914239B2Jul 5, 2005
System for analyzing mass spectrometric data
HITACHI HIGH TECH CORP13 citations83