Inventor
HIRAO MASAYOSHI
JP7 patents
Patents
7 patentsUS10224388B2Mar 5, 2019
Wiring core structure, semiconductor evaluation device and semiconductor device
MITSUBISHI ELECTRIC CORP2 citations70
US6788082B2Sep 7, 2004
Probe card
MITSUBISHI ELECTRIC CORP8 citations70
US6831351B2Dec 14, 2004
Semiconductor device with semiconductor chip formed by using wide gap semiconductor as base material
MITSUBISHI ELECTRIC CORP10 citations68
US11774476B2Oct 3, 2023
Input capacitance measurement circuit and method of manufacturing semiconductor device
MITSUBISHI ELECTRIC CORP1 citations55
US7057298B2Jun 6, 2006
Semiconductor device with semiconductor chip formed by using wide gap semiconductor as base material
MITSUBISHI ELECTRIC CORP1 citations47
US6861730B2Mar 1, 2005
Semiconductor device with semiconductor chip formed by using wide gap semiconductor as base material
MITSUBISHI ELECTRIC CORP0 citations47
US10665670B2May 26, 2020
Semiconductor device and method for manufacturing same
MITSUBISHI ELECTRIC CORP0 citations36