Inventor

MOTOHAMA MASAYUKI

JP3 patents

⚠️ This page may combine multiple inventors who share the name “MOTOHAMA MASAYUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MATASUSHITA ELECTRIC IND CO LT

1 patent

US5901154AMay 4, 1999

Method for producing test program for semiconductor device

MATASUSHITA ELECTRIC IND CO LT16 citations65

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD

1 patent

US5894424AApr 13, 1999

Semiconductor testing apparatus

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD5 citations57

PANASONIC CORP

1 patent

US7565582B2Jul 21, 2009

Circuit for testing the AC timing of an external input/output terminal of a semiconductor integrated circuit

PANASONIC CORP5 citations56