P

Inventor

BUCKHEIT JONATHAN B

US7 patents
⚠️ This page may combine multiple inventors who share the name “BUCKHEIT JONATHAN B”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

RUDOLPH TECHNOLOGIES INC

3 patents
US8380472B2Feb 19, 2013

Semiconductor yield management system and method

RUDOLPH TECHNOLOGIES INC5 citations71
USRE42481EJun 21, 2011

Semiconductor yield management system and method

RUDOLPH TECHNOLOGIES INC2 citations59
US7954018B2May 31, 2011

Analysis techniques for multi-level memory

RUDOLPH TECHNOLOGIES INC4 citations59

YIELD DYNAMICS INC

1 patent
US6470229B1Oct 22, 2002

Semiconductor yield management system and method

YIELD DYNAMICS INC37 citations88

YIELD DYAMICS INC

1 patent
US6768961B2Jul 27, 2004

System and method for analyzing error information from a semiconductor fabrication process

YIELD DYAMICS INC4 citations56

HO TOM T

1 patent
US8190952B2May 29, 2012

Bitmap cluster analysis of defects in integrated circuits

HO TOM T3 citations54

MKS INSTR INC

1 patent
US7685481B2Mar 23, 2010

Bitmap cluster analysis of defects in integrated circuits

MKS INSTR INC0 citations49