Inventor

JAKATDAR NICKHIL

US48 patents

⚠️ This page may combine multiple inventors who share the name “JAKATDAR NICKHIL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

JAKATDAR NICKHIL

TIMBRE TECH INC

Generation of a library of periodic grating diffraction signals

Method and system of dynamic learning through a regression-based library generation process

Overlay measurements using periodic gratings

Metrology hardware specification using a hardware simulator

Grating test patterns and methods for overlay metrology

Optical profilometry of additional-material deviations in a periodic grating

Model and parameter selection for optical metrology

Model optimization for structures with additional materials

System and method for real-time library generation of grating profiles

Profile refinement for integrated circuit metrology

Generic interface for an optical metrology system

Optimized model and parameter selection for optical metrology

Generation of a library of periodic grating diffraction signals

Generation and use of integrated circuit profile-based simulation information

Generating a library of simulated-diffraction signals and hypothetical profiles of periodic gratings

Method and system for dynamic learning through a regression-based library generation process

Grating test patterns and methods for overlay metrology

Optical profilometry of additional-material deviations in a periodic grating

Balancing planarization of layers and the effect of underlying structure on the metrology signal

System and method for characterizing macro-grating test patterns in advanced lithography and etch processes

System and method for grating profile classification

Selection of wavelengths for integrated circuit optical metrology

Metrology diffraction signal adaptation for tool-to-tool matching

Generic interface for an optical metrology system

Selecting a hypothetical profile to use in optical metrology

Model and parameter selection for optical metrology

Generic interface for an optical metrology system

System and method for characterizing macro-grating test patterns in advanced lithography and etch processes

Combined optical profilometry and projection microscopy of integrated circuit structures

System and method for efficient simulation of reflectometry response from two-dimensional grating structures

Measurement of metal electroplating and seed layer thickness and profile

Balancing planarization of layers and the effect of underlying structure on the metrology signal

Method and system of dynamic learning through a regression-based library generation process

Selection of wavelengths for integrated circuit optical metrology

TOKYO ELECTRON LTD

Optical metrology of structures formed on semiconductor wafers using machine learning systems

Generation and use of integrated circuit profile-based simulation information

Generation of a library of periodic grating diffraction signals

CHAN KEVIN

Modeling and cross correlation of design predicted criticalities for optimization of semiconductor manufacturing

Method and system for process optimization

Method and system for mask optimization

Vuclip

Offline content distribution networks

Offline content distribution networks

CADENCE DESIGN SYSTEMS INC

Modeling and cross correlation of design predicted criticalities for optimization of semiconductor manufacturing

Method and system for inspection optimization in design and production of integrated circuits

NAT SEMICONDUCTOR CORP

Chemical gas analysis during processing of chemically amplified photoresist systems

PCCW VUCLIP SINGAPORE PTE LTD

Offline content distribution networks

VUCLIP (SINGAPORE) PTE LTD

Offline content distribution networks

SONG LI J

Methods, systems, and computer program products for implementing compact manufacturing models in electronic design automation