Inventor
BIHANI DEEPAK KUMAR
IN5 patents
Patents
5 patentsUS11742045B2Aug 29, 2023
Testing of comparators within a memory safety logic circuit using a fault enable generation circuit within the memory
ST MICROELECTRONICS INT NV2 citations70
US10998077B2May 4, 2021
Testing of comparators within a memory safety logic circuit using a fault enable generation circuit within the memory
ST MICROELECTRONICS INT NV3 citations70
US11025252B2Jun 1, 2021
Circuit for detection of single bit upsets in generation of internal clock for memory
ST MICROELECTRONICS INT NV0 citations58
US10637447B2Apr 28, 2020
Low voltage, master-slave flip-flop
ST MICROELECTRONICS INT NV0 citations47
US10277207B1Apr 30, 2019
Low voltage, master-slave flip-flop
ST MICROELECTRONICS INT NV0 citations47