Inventor
Fan liang-fu
US11 patents
⚠️ This page may combine multiple inventors who share the name “Fan liang-fu”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CHEN ZHONGWEI
7 patentsUS11094499B1Aug 17, 2021
Apparatus of charged-particle beam such as electron microscope comprising sliding specimen table within objective lens
CHEN ZHONGWEI5 citations83
US11257659B1Feb 22, 2022
Electrode assembly, electronic apparatus/device using the same, and apparatus of charged-particle beam such as electron microscope using the same
CHEN ZHONGWEI2 citations72
US11593938B2Feb 28, 2023
Rapid and automatic virus imaging and analysis system as well as methods thereof
CHEN ZHONGWEI1 citations62
US11569059B2Jan 31, 2023
Apparatus of charged-particle beam such as electron microscope comprising plasma generator, and method thereof
CHEN ZHONGWEI1 citations62
US11355312B2Jun 7, 2022
Stage driving system and apparatus or device such as apparatus of charged-particle beam comprising the same
CHEN ZHONGWEI0 citations62
US11328898B2May 10, 2022
Digital detector, apparatus of charged-particle beam such as electron microscope comprising the same, and method thereof
CHEN ZHONGWEI0 citations62
US11295927B1Apr 5, 2022
Apparatus of charged-particle beam such as electron microscope comprising co-condensers for continuous image resolution tuning
CHEN ZHONGWEI0 citations62
BORRIES PTE LTD
4 patentsUS11854763B1Dec 26, 2023
Backscattered electron detector, apparatus of charged-particle beam such as electron microscope comprising the same, and method thereof
BORRIES PTE LTD0 citations60
US11664186B1May 30, 2023
Apparatus of electron beam comprising pinnacle limiting plate and method of reducing electron-electron interaction
BORRIES PTE LTD1 citations60
US11664189B2May 30, 2023
Apparatus of charged-particle beam such as scanning electron microscope comprising plasma generator, and method thereof
BORRIES PTE LTD1 citations60
US11854762B1Dec 26, 2023
MEMS sample holder, packaged product thereof, and apparatus of charged-particle beam such as electron microscope using the same
BORRIES PTE LTD0 citations50