Inventor

PARK CHAN SOON

KR2 patents

⚠️ This page may combine multiple inventors who share the name “PARK CHAN SOON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

1 patent

US7323891B2Jan 29, 2008

Method of testing a semiconductor chip and jig used in the method

SAMSUNG ELECTRONICS CO LTD3 citations58

HYUNDAI AUTOEVER CORP

1 patent

US12158799B2Dec 3, 2024

Detection and recovery of deadlocks in database management system

HYUNDAI AUTOEVER CORP0 citations54