Inventor

TAKEOKA SADAMI

JP23 patents

⚠️ This page may combine multiple inventors who share the name “TAKEOKA SADAMI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAKEOKA SADAMI

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD

Semiconductor device having a device for testing the semiconductor

Semiconductor integrated circuit device, method of testing the same, database for design of the same and method of designing the same

Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device

Method and apparatus for generating test pattern for sequential logic circuit of integrated circuit

Method for generating test pattern for semiconductor integrated circuit and method for testing semiconductor integrated circuit

Method for inserting test circuit and method for converting test data

Semiconductor integrated circuit and testing method for the same

Database for designing integrated circuit device, and method for designing integrated circuit device

Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device

Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device

Method of generating test pattern for semiconductor integrated circuit and method of testing the same

Method of designing semiconductor integrated circuit

Functional block for integrated circuit, semiconductor integrated circuit, inspection method for semiconductor integrated circuit, and designing method therefor

Methods for evaluating quality of test sequences for delay faults and related technology

Semiconductor integrated circuit device, method of testing the same, database for design of the same and method of designing the same

Method of designing semiconductor integrated circuit utilizing a scan test function

Semiconductor integrated circuit and method for testing the semiconductor integrated circuit

Semiconductor integrated circuit, method for designing the same, and storage medium where design program for semiconductor integrated circuit is stored

Method for evaluating delay test quality

PANASONIC CORP

Semiconductor integrated circuit, and designing method and testing method thereof

Semiconductor integrated circuit and method for testing the same

Semiconductor integrated circuit and method for testing the same

Method of designing semiconductor integrated circuit in which fault detection can be effected through scan-in and scan-out