Inventor

MOTOHARA AKIRA

JP17 patents

⚠️ This page may combine multiple inventors who share the name “MOTOHARA AKIRA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MOTOHARA AKIRA

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD

Semiconductor integrated circuit with a testable block

Semiconductor integrated circuit with a testable block

Method and apparatus for generating test pattern for sequential logic circuit of integrated circuit

LSI design method and verification method

Method of designing integrated circuit device using common parameter at different design levels, and database thereof

Method for designing integrated circuit based on the transaction analyzing model

Method for improving the efficiency of designing a system-on-chip integrated circuit device

Method of designing semiconductor integrated circuit

Method and apparatus for performing automatic test pattern generation

Method of test sequence generation

Method for designing integrated circuit device and database for design of integrated circuit device

ID installable LSI, secret key installation method, LSI test method, and LSI development method

Method of designing semiconductor integrated circuit utilizing a scan test function

Method for designing integrated circuit device

Test sequence generation method

Semiconductor device, function setting method thereof, and evaluation method thereof

MATSUSHITA ELECTCRIC IND CO LT

Method for generating test sequences for detecting faults in target scan logical blocks