Inventor

ANNIGERI BALKRISHNA S

US4 patents

Patents

4 patents

US6768312B2Jul 27, 2004

Structural integrity monitoring system including wireless electromechanical impedance measurement

UNITED TECHNOLOGIES CORP61 citations92

US5517861AMay 21, 1996

High temperature crack monitoring apparatus

UNITED TECHNOLOGIES CORP26 citations90

US5673203ASep 30, 1997

Crack monitoring apparatus

UNITED TECHNOLOGIES CORP18 citations89

US5539656AJul 23, 1996

Crack monitoring apparatus

UNITED TECHNOLOGIES CORP34 citations89