Inventor
KANAMARU MASATOSHI
JP37 patents
⚠️ This page may combine multiple inventors who share the name “KANAMARU MASATOSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
23 patentsUS6444172B2Sep 3, 2002
Water quality meter and water quality monitoring system
HITACHI LTD40 citations96
US6290908B1Sep 18, 2001
Water quality meter and water monitoring system
HITACHI LTD47 citations96
US5276573AJan 4, 1994
Slider unit controllably actuated at a surface of a moving information recording medium
HITACHI LTD99 citations96
US6531327B2Mar 11, 2003
Method for manufacturing semiconductor device utilizing semiconductor testing equipment
HITACHI LTD17 citations92
US6507204B1Jan 14, 2003
Semiconductor testing equipment with probe formed on a cantilever of a substrate
HITACHI LTD40 citations92
US6398930B2Jun 4, 2002
Water quality meter and water quality monitoring system
HITACHI LTD28 citations92
US6358762B1Mar 19, 2002
Manufacture method for semiconductor inspection apparatus
HITACHI LTD38 citations92
US5163209ANov 17, 1992
Method of manufacturing a stack-type piezoelectric element
HITACHI LTD37 citations92
US4732369AMar 22, 1988
Arc apparatus for producing ultrafine particles
HITACHI LTD49 citations92
US4610718ASep 9, 1986
Method for manufacturing ultra-fine particles
HITACHI LTD49 citations92
US6496023B1Dec 17, 2002
Semiconductor-device inspecting apparatus and a method for manufacturing the same
HITACHI LTD20 citations91
US6566149B1May 20, 2003
Method for manufacturing substrate for inspecting semiconductor device
HITACHI LTD22 citations90
US6511857B1Jan 28, 2003
Process for manufacturing semiconductor device
HITACHI LTD15 citations84
US5032248AJul 16, 1991
Gas sensor for measuring air-fuel ratio and method of manufacturing the gas sensor
HITACHI LTD21 citations82
US6955870B2Oct 18, 2005
Method of manufacturing a semiconductor device
HITACHI LTD6 citations74
US6714030B2Mar 30, 2004
Semiconductor inspection apparatus
HITACHI LTD7 citations74
US6573112B2Jun 3, 2003
Semiconductor device manufacturing method
HITACHI LTD6 citations74
US6548315B2Apr 15, 2003
Manufacture method for semiconductor inspection apparatus
HITACHI LTD8 citations74
US6479305B2Nov 12, 2002
Semiconductor device manufacturing method
HITACHI LTD10 citations74
US4915814AApr 10, 1990
Sensor for measurement of air/fuel ratio and method of manufacturing
HITACHI LTD19 citations73
US7457206B2Nov 25, 2008
Optical head, optical information storage apparatus, and their fabrication method
HITACHI LTD3 citations63
US6660541B2Dec 9, 2003
Semiconductor device and a manufacturing method thereof
HITACHI LTD6 citations63
US6465264B1Oct 15, 2002
Method for producing semiconductor device and apparatus usable therein
HITACHI LTD4 citations62
RENESAS TECH CORP
7 patentsUS6774654B2Aug 10, 2004
Semiconductor-device inspecting apparatus and a method for manufacturing the same
RENESAS TECH CORP16 citations91
US6828810B2Dec 7, 2004
Semiconductor device testing apparatus and method for manufacturing the same
RENESAS TECH CORP14 citations84
US6952110B2Oct 4, 2005
Testing apparatus for carrying out inspection of a semiconductor device
RENESAS TECH CORP6 citations74
US6864568B2Mar 8, 2005
Packaging device for holding a plurality of semiconductor devices to be inspected
RENESAS TECH CORP10 citations73
US7018857B2Mar 28, 2006
Method of manufacturing a semiconductor device including defect inspection using a semiconductor testing probe
RENESAS TECH CORP6 citations63
US6864695B2Mar 8, 2005
Semiconductor device testing apparatus and semiconductor device manufacturing method using it
RENESAS TECH CORP5 citations63
US7119362B2Oct 10, 2006
Method of manufacturing semiconductor apparatus
RENESAS TECH CORP0 citations52