Inventor
ARIGA AKIHIKO
JP15 patents
⚠️ This page may combine multiple inventors who share the name “ARIGA AKIHIKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
12 patentsUS6305230B1Oct 23, 2001
Connector and probing system
HITACHI LTD79 citations95
US6566150B2May 20, 2003
Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step
HITACHI LTD15 citations92
US6531327B2Mar 11, 2003
Method for manufacturing semiconductor device utilizing semiconductor testing equipment
HITACHI LTD17 citations92
US6507204B1Jan 14, 2003
Semiconductor testing equipment with probe formed on a cantilever of a substrate
HITACHI LTD40 citations92
US6455335B1Sep 24, 2002
Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step
HITACHI LTD17 citations92
US6566149B1May 20, 2003
Method for manufacturing substrate for inspecting semiconductor device
HITACHI LTD22 citations90
US6511857B1Jan 28, 2003
Process for manufacturing semiconductor device
HITACHI LTD15 citations84
US6197603B1Mar 6, 2001
Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step
HITACHI LTD12 citations82
US6573112B2Jun 3, 2003
Semiconductor device manufacturing method
HITACHI LTD6 citations74
US6479305B2Nov 12, 2002
Semiconductor device manufacturing method
HITACHI LTD10 citations74
US7285430B2Oct 23, 2007
Connection device and test system
HITACHI LTD3 citations62
US7198962B2Apr 3, 2007
Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step
HITACHI LTD3 citations62