Inventor
BAN NAOTO
JP18 patents
⚠️ This page may combine multiple inventors who share the name “BAN NAOTO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
12 patentsUS6566150B2May 20, 2003
Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step
HITACHI LTD15 citations92
US6455335B1Sep 24, 2002
Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step
HITACHI LTD17 citations92
US6358762B1Mar 19, 2002
Manufacture method for semiconductor inspection apparatus
HITACHI LTD38 citations92
US6496023B1Dec 17, 2002
Semiconductor-device inspecting apparatus and a method for manufacturing the same
HITACHI LTD20 citations91
US6566149B1May 20, 2003
Method for manufacturing substrate for inspecting semiconductor device
HITACHI LTD22 citations90
US6511857B1Jan 28, 2003
Process for manufacturing semiconductor device
HITACHI LTD15 citations84
US6197603B1Mar 6, 2001
Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step
HITACHI LTD12 citations82
US6714030B2Mar 30, 2004
Semiconductor inspection apparatus
HITACHI LTD7 citations74
US6573112B2Jun 3, 2003
Semiconductor device manufacturing method
HITACHI LTD6 citations74
US6548315B2Apr 15, 2003
Manufacture method for semiconductor inspection apparatus
HITACHI LTD8 citations74
US6479305B2Nov 12, 2002
Semiconductor device manufacturing method
HITACHI LTD10 citations74
US7198962B2Apr 3, 2007
Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step
HITACHI LTD3 citations62
RENESAS TECH CORP
5 patentsUS6696849B2Feb 24, 2004
Fabrication method of semiconductor integrated circuit device and its testing apparatus
RENESAS TECH CORP75 citations97
US6774654B2Aug 10, 2004
Semiconductor-device inspecting apparatus and a method for manufacturing the same
RENESAS TECH CORP16 citations91
US6828810B2Dec 7, 2004
Semiconductor device testing apparatus and method for manufacturing the same
RENESAS TECH CORP14 citations84
US6864695B2Mar 8, 2005
Semiconductor device testing apparatus and semiconductor device manufacturing method using it
RENESAS TECH CORP5 citations63
US7119362B2Oct 10, 2006
Method of manufacturing semiconductor apparatus
RENESAS TECH CORP0 citations52