Inventor
GROSS KENNETH P
US31 patents
⚠️ This page may combine multiple inventors who share the name “GROSS KENNETH P”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
KLA TENCOR CORP
15 patentsUS6271916B1Aug 7, 2001
Process and assembly for non-destructive surface inspections
KLA TENCOR CORP278 citations97
US7102744B2Sep 5, 2006
Process and assembly for non-destructive surface inspections
KLA TENCOR CORP12 citations91
US6606153B2Aug 12, 2003
Process and assembly for non-destructive surface inspections
KLA TENCOR CORP31 citations91
US9558858B2Jan 31, 2017
System and method for imaging a sample with a laser sustained plasma illumination output
KLA TENCOR CORP9 citations84
US9390902B2Jul 12, 2016
Method and system for controlling convective flow in a light-sustained plasma
KLA TENCOR CORP13 citations84
US10690589B2Jun 23, 2020
Laser sustained plasma light source with forced flow through natural convection
KLA TENCOR CORP8 citations81
US10283342B2May 7, 2019
Laser sustained plasma light source with graded absorption features
KLA TENCOR CORP2 citations72
US7477371B2Jan 13, 2009
Process and assembly for non-destructive surface inspections
KLA TENCOR CORP6 citations72
US9615439B2Apr 4, 2017
System and method for inhibiting radiative emission of a laser-sustained plasma source
KLA TENCOR CORP5 citations71
US9899205B2Feb 20, 2018
System and method for inhibiting VUV radiative emission of a laser-sustained plasma source
KLA TENCOR CORP2 citations69
US8045250B1Oct 25, 2011
Optical scanning using rotating parallel plate
KLA TENCOR CORP6 citations63
US10139283B2Nov 27, 2018
Non-contact thermal measurements of VUV optics
KLA TENCOR CORP1 citations52
US9887076B2Feb 6, 2018
Method and system for controlling convective flow in a light-sustained plasma
KLA TENCOR CORP0 citations52
US10616987B2Apr 7, 2020
System and method for imaging a sample with an illumination source modified by a spatial selective wavelength filter
KLA TENCOR CORP0 citations42
US10386234B2Aug 20, 2019
Wideband spectrograph
KLA TENCOR CORP0 citations42
KLA TENCOR TECH CORP
6 patentsUS7317531B2Jan 8, 2008
Apparatus and methods for detecting overlay errors using scatterometry
KLA TENCOR TECH CORP83 citations98
US7463369B2Dec 9, 2008
Systems and methods for measuring one or more characteristics of patterned features on a specimen
KLA TENCOR TECH CORP28 citations93
US7933016B2Apr 26, 2011
Apparatus and methods for detecting overlay errors using scatterometry
KLA TENCOR TECH CORP15 citations92
US7379183B2May 27, 2008
Apparatus and methods for detecting overlay errors using scatterometry
KLA TENCOR TECH CORP18 citations92
US7277172B2Oct 2, 2007
Measuring overlay and profile asymmetry using symmetric and anti-symmetric scatterometry signals
KLA TENCOR TECH CORP34 citations92
US7433037B2Oct 7, 2008
System for measuring periodic structures
KLA TENCOR TECH CORP1 citations52
TENCOR INSTRUMENTS
4 patentsUS5416594AMay 16, 1995
Surface scanner with thin film gauge
TENCOR INSTRUMENTS210 citations99
US5189481AFeb 23, 1993
Particle detector for rough surfaces
TENCOR INSTRUMENTS276 citations99
US5565979AOct 15, 1996
Surface scanning apparatus and method using crossed-cylinder optical elements
TENCOR INSTRUMENTS56 citations92
US5083035AJan 21, 1992
Position location in surface scanning using interval timing between scan marks on test wafers
TENCOR INSTRUMENTS25 citations92