Inventor

BASSETT ROBERT W

US6 patents

⚠️ This page may combine multiple inventors who share the name “BASSETT ROBERT W”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

5 patents

US4878209AOct 31, 1989

Apparatus and method for hardware-assisted diagnosis of broken logic-test shift-registers

IBM4 citations60

US7010733B2Mar 7, 2006

Parametric testing for high pin count ASIC

IBM6 citations57

BASSETT ROBERT W

1 patent

US8209141B2Jun 26, 2012

System and method for automatically generating test patterns for at-speed structural test of an integrated circuit device using an incremental approach to reduce test pattern count

BASSETT ROBERT W7 citations76

BASSETT ROBERT W

IBM

Macro performance test

Integrated circuit driver inhibit control test method

Method for testing integrated logic circuits

Apparatus and method for hardware-assisted diagnosis of broken logic-test shift-registers

Parametric testing for high pin count ASIC

BASSETT ROBERT W

System and method for automatically generating test patterns for at-speed structural test of an integrated circuit device using an incremental approach to reduce test pattern count