Inventor
SKERGAN TIMOTHY M
US26 patents
⚠️ This page may combine multiple inventors who share the name “SKERGAN TIMOTHY M”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
22 patentsUS6550020B1Apr 15, 2003
Method and system for dynamically configuring a central processing unit with multiple processing cores
IBM114 citations98
US6006311ADec 21, 1999
Dynamic updating of repair mask used for cache defect avoidance
IBM74 citations96
US5958068ASep 28, 1999
Cache array defect functional bypassing using repair mask
IBM58 citations96
US6539491B1Mar 25, 2003
Method and apparatus for implementing IEEE 1149.1 compliant boundary scan
IBM55 citations95
US6085288AJul 4, 2000
Dual cache directories with respective queue independently executing its content and allowing staggered write operations
IBM29 citations93
US6023746AFeb 8, 2000
Dual associative-cache directories allowing simultaneous read operation using two buses with multiplexors, address tags, memory block control signals, single clock cycle operation and error correction
IBM37 citations93
US5883904AMar 16, 1999
Method for recoverability via redundant cache arrays
IBM37 citations93
US5867511AFeb 2, 1999
Method for high-speed recoverable directory access
IBM24 citations93
US7400555B2Jul 15, 2008
Built in self test circuit for measuring total timing uncertainty in a digital data path
IBM24 citations92
US6654917B1Nov 25, 2003
Method and apparatus for scanning free-running logic
IBM18 citations92
US6665828B1Dec 16, 2003
Globally distributed scan blocks
IBM44 citations91
US6452435B1Sep 17, 2002
Method and apparatus for scanning and clocking chips with a high-speed free running clock in a manufacturing test environment
IBM40 citations91
US5943686AAug 24, 1999
Multiple cache directories for non-arbitration concurrent accessing of a cache memory
IBM19 citations84
US7467204B2Dec 16, 2008
Method for providing low-level hardware access to in-band and out-of-band firmware
IBM14 citations83
US7073106B2Jul 4, 2006
Test method for guaranteeing full stuck-at-fault coverage of a memory array
IBM18 citations81
US7856582B2Dec 21, 2010
Techniques for logic built-in self-test diagnostics of integrated circuit devices
IBM9 citations80
US7519889B1Apr 14, 2009
System and method to reduce LBIST manufacturing test time of integrated circuits
IBM10 citations78
US7418541B2Aug 26, 2008
Method for indirect access to a support interface for memory-mapped resources to reduce system connectivity from out-of-band support processor
IBM5 citations62
US7895490B2Feb 22, 2011
Method and system for testing an electronic circuit to identify multiple defects
IBM4 citations57
US7916722B2Mar 29, 2011
Method for indirect access to a support interface for memory-mapped resources to reduce system connectivity from out-of-band support processor
IBM0 citations51
US7313747B2Dec 25, 2007
Measuring microprocessor susceptibility to internal noise generation
IBM1 citations50
US8365006B2Jan 29, 2013
Preventing circumvention of function disablement in an information handling system
IBM1 citations47