Inventor
MUELLER JOCHEN
DE66 patents
⚠️ This page may combine multiple inventors who share the name “MUELLER JOCHEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INFINEON TECHNOLOGIES AG
22 patentsUS6744127B2Jun 1, 2004
Semiconductor chip, memory module and method for testing the semiconductor chip
INFINEON TECHNOLOGIES AG20 citations93
US6825682B2Nov 30, 2004
Test configuration for the functional testing of a semiconductor chip
INFINEON TECHNOLOGIES AG24 citations92
US6556492B2Apr 29, 2003
System for testing fast synchronous semiconductor circuits
INFINEON TECHNOLOGIES AG31 citations92
US6871306B2Mar 22, 2005
Method and device for reading and for checking the time position of data response signals read out from a memory module to be tested
INFINEON TECHNOLOGIES AG12 citations84
US6721904B2Apr 13, 2004
System for testing fast integrated digital circuits, in particular semiconductor memory modules
INFINEON TECHNOLOGIES AG15 citations84
US6458631B1Oct 1, 2002
Method for fabricating an integrated circuit, in particular an antifuse
INFINEON TECHNOLOGIES AG17 citations83
US6515319B2Feb 4, 2003
Field-effect-controlled transistor and method for fabricating the transistor
INFINEON TECHNOLOGIES AG17 citations82
US7117404B2Oct 3, 2006
Test circuit for testing a synchronous memory circuit
INFINEON TECHNOLOGIES AG8 citations73
US6618305B2Sep 9, 2003
Test circuit for testing a circuit
INFINEON TECHNOLOGIES AG8 citations73
US11302579B2Apr 12, 2022
Composite wafer, semiconductor device and electronic component
INFINEON TECHNOLOGIES AG1 citations72
US10672664B2Jun 2, 2020
Composite wafer, semiconductor device, electronic component and method of manufacturing a semiconductor device
INFINEON TECHNOLOGIES AG2 citations72
US6853206B2Feb 8, 2005
Method and probe card configuration for testing a plurality of integrated circuits in parallel
INFINEON TECHNOLOGIES AG11 citations71
US6429503B2Aug 6, 2002
Connection element in an integrated circuit having a layer structure disposed between two conductive structures
INFINEON TECHNOLOGIES AG13 citations71
US6914811B2Jul 5, 2005
Method of driving one-time operable isolation elements and circuit for driving the isolation elements
INFINEON TECHNOLOGIES AG4 citations63
US6560149B2May 6, 2003
Integrated semiconductor memory device
INFINEON TECHNOLOGIES AG5 citations63
US6545927B2Apr 8, 2003
Integrated semiconductor circuit, in particular a semiconductor memory configuration, and method for its operation
INFINEON TECHNOLOGIES AG4 citations63
US11848237B2Dec 19, 2023
Composite wafer, semiconductor device and electronic component
INFINEON TECHNOLOGIES AG0 citations62
US10748801B2Aug 18, 2020
Carrier arrangement and method for processing a carrier by generating a crack structure
INFINEON TECHNOLOGIES AG1 citations62
US7062690B2Jun 13, 2006
System for testing fast synchronous digital circuits, particularly semiconductor memory chips
INFINEON TECHNOLOGIES AG3 citations62
US6865707B2Mar 8, 2005
Test data generator
INFINEON TECHNOLOGIES AG6 citations62
US6862702B2Mar 1, 2005
Address counter for addressing synchronous high-frequency digital circuits, in particular memory devices
INFINEON TECHNOLOGIES AG3 citations62
US6839397B2Jan 4, 2005
Circuit configuration for generating control signals for testing high-frequency synchronous digital circuits
INFINEON TECHNOLOGIES AG3 citations62
AIRBUS GMBH
3 patents(unassigned)
2 patentsSIEMENS AG
2 patentsAGILENT TECHNOLOGIES INC
2 patentsHARVARD COLLEGE
2 patentsUNIV TWENTE
2 patentsDAIMLER CHRYSLER AEROSPACE
1 patentSAP AG
1 patentINFINEON TECHOLOGIES AG
1 patentINFINEON TECHONOLOGIES AG
1 patentMUELLER JOCHEN
1 patentZEISS CARL MICROIMAGING GMBH
1 patentTRUMA GERATETECHNIK GMBH & CO KG
1 patentTRUMA GERAETETECHNIK GMBH & CO
1 patentFEV MOTORENTECH GMBH
1 patentTRUMA GERÄTETECHNIK GMBH & CO KG
1 patentHOGH ROBERT
1 patentBOSCH MAHLE TURBO SYSTEMS GMBH & CO KG
1 patentCONTINENTAL TEVES AG & CO OHG
1 patentBOSCH GMBH ROBERT
1 patentVELBON K K
1 patentShowing the top 50 of 66 patents by PatentIndex Score.