Inventor
CHEN HSIN-HSIEN
TW3 patents
Patents
3 patentsUS10247774B2Apr 2, 2019
Test key structure and method of measuring resistance of vias
UNITED MICROELECTRONICS CORP1 citations60
US10529707B2Jan 7, 2020
Intra-metal capacitor and method of forming the same
UNITED MICROELECTRONICS CORP0 citations49
US10002864B1Jun 19, 2018
Intra-metal capacitor and method of forming the same
UNITED MICROELECTRONICS CORP0 citations49