Inventor
HSIEH YAO-SHENG
TW3 patents
Patents
3 patentsUS10269660B2Apr 23, 2019
Metrology sampling method with sampling rate decision scheme and computer program product thereof
UNIV NAT CHENG KUNG2 citations65
US10242319B2Mar 26, 2019
Baseline predictive maintenance method for target device and computer program product thereof
UNIV NAT CHENG KUNG5 citations65
US10935962B2Mar 2, 2021
System and method for identifying root causes of yield loss
UNIV NAT CHENG KUNG0 citations42