Inventor
Fujino Keita
JP6 patents
Patents
6 patentsUS10598691B2Mar 24, 2020
Scanning probe microscope and light intensity adjusting method
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Surface analyzer
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Information providing system, server device, and analyzer
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US11454647B2Sep 27, 2022
Scanning type probe microscope and control device for scanning type probe microscope
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US11054441B2Jul 6, 2021
Scanning probe microscope and position adjustment method for scanning probe microscope
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US10641790B2May 5, 2020
Scanning probe microscope
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