Inventor
JOVANOVIC JOVAN
US58 patents
⚠️ This page may combine multiple inventors who share the name “JOVANOVIC JOVAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
AEHR TEST SYSTEMS
42 patentsUS7762822B2Jul 27, 2010
Apparatus for testing electronic devices
AEHR TEST SYSTEMS29 citations96
US8030957B2Oct 4, 2011
System for testing an integrated circuit of a device and its method of use
AEHR TEST SYSTEMS42 citations95
US11592465B2Feb 28, 2023
Pressure relief valve
AEHR TEST SYSTEMS13 citations93
US11255903B2Feb 22, 2022
Apparatus for testing electronic devices
AEHR TEST SYSTEMS12 citations93
US11112429B2Sep 7, 2021
Pressure relief valve
AEHR TEST SYSTEMS18 citations93
US10401385B2Sep 3, 2019
Limiting translation for consistent substrate-to-substrate contact
AEHR TEST SYSTEMS20 citations93
US9880197B2Jan 30, 2018
Controlling alignment during a thermal cycle
AEHR TEST SYSTEMS21 citations93
US9625521B2Apr 18, 2017
Controlling alignment during a thermal cycle
AEHR TEST SYSTEMS23 citations93
US6867608B2Mar 15, 2005
Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component
AEHR TEST SYSTEMS32 citations93
US9316683B2Apr 19, 2016
Apparatus for testing electronic devices
AEHR TEST SYSTEMS19 citations92
US6853209B1Feb 8, 2005
Contactor assembly for testing electrical circuits
AEHR TEST SYSTEMS42 citations92
US7969175B2Jun 28, 2011
Separate test electronics and blower modules in an apparatus for testing an integrated circuit
AEHR TEST SYSTEMS27 citations91
US6815966B1Nov 9, 2004
System for burn-in testing of electronic devices
AEHR TEST SYSTEMS24 citations90
US11977098B2May 7, 2024
System for testing an integrated circuit of a device and its method of use
AEHR TEST SYSTEMS5 citations85
US11448695B2Sep 20, 2022
System for testing an integrated circuit of a device and its method of use
AEHR TEST SYSTEMS3 citations84
US11835575B2Dec 5, 2023
Electronics tester
AEHR TEST SYSTEMS11 citations82
US12292484B2May 6, 2025
Method and system for thermal control of devices in an electronics tester
AEHR TEST SYSTEMS1 citations75
US7511521B2Mar 31, 2009
Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component
AEHR TEST SYSTEMS5 citations74
US7301358B2Nov 27, 2007
Contactor assembly for testing electrical circuits
AEHR TEST SYSTEMS6 citations74
US7046022B2May 16, 2006
Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component
AEHR TEST SYSTEMS7 citations74
US12007451B2Jun 11, 2024
Method and system for thermal control of devices in an electronics tester
AEHR TEST SYSTEMS2 citations73
US10649022B2May 12, 2020
Electronics tester
AEHR TEST SYSTEMS1 citations73
US10466292B2Nov 5, 2019
Method and system for thermal control of devices in an electronics tester
AEHR TEST SYSTEMS1 citations73
USD850309SJun 4, 2019
Layout of contacts
AEHR TEST SYSTEMS4 citations73
US9151797B2Oct 6, 2015
Apparatus for testing electronic devices
AEHR TEST SYSTEMS2 citations73
US8747123B2Jun 10, 2014
Apparatus for testing electronic devices
AEHR TEST SYSTEMS2 citations73
US7063544B2Jun 20, 2006
System for burn-in testing of electronic devices
AEHR TEST SYSTEMS7 citations71
USD629760SDec 28, 2010
Interface on an electronics connector
AEHR TEST SYSTEMS3 citations63
US7385407B2Jun 10, 2008
Assembly for electrically connecting a test component to a testing machine for testing electrical circuits on the test component
AEHR TEST SYSTEMS1 citations63
US12326472B2Jun 10, 2025
System for testing an integrated circuit of a device and its method of use
AEHR TEST SYSTEMS0 citations62
US12298328B2May 13, 2025
Controlling alignment during a thermal cycle
AEHR TEST SYSTEMS0 citations62
US12265136B2Apr 1, 2025
Method and system for thermal control of devices in electronics tester
AEHR TEST SYSTEMS0 citations62
US12169217B2Dec 17, 2024
Electronics tester
AEHR TEST SYSTEMS0 citations62
US12163999B2Dec 10, 2024
Apparatus for testing electronic devices
AEHR TEST SYSTEMS0 citations62
US11860221B2Jan 2, 2024
Apparatus for testing electronic devices
AEHR TEST SYSTEMS0 citations62
US11821940B2Nov 21, 2023
Electronics tester
AEHR TEST SYSTEMS0 citations62
US11635459B2Apr 25, 2023
Electronics tester
AEHR TEST SYSTEMS0 citations62
US11209497B2Dec 28, 2021
Method and system for thermal control of devices in an electronics tester
AEHR TEST SYSTEMS0 citations62
US11199572B2Dec 14, 2021
Electronics tester
AEHR TEST SYSTEMS0 citations62
US10852347B2Dec 1, 2020
Apparatus for testing electronic devices
AEHR TEST SYSTEMS0 citations62
US12282062B2Apr 22, 2025
Electronics tester
AEHR TEST SYSTEMS0 citations59
US12253560B2Mar 18, 2025
Electronics tester
AEHR TEST SYSTEMS0 citations59
RICHMOND II DONALD P
4 patentsUS8628336B2Jan 14, 2014
Apparatus for testing electronic devices
RICHMOND II DONALD P26 citations95
US8506335B2Aug 13, 2013
Apparatus for testing electronic devices
RICHMOND II DONALD P31 citations95
US8388357B2Mar 5, 2013
Apparatus for testing electronic devices
RICHMOND II DONALD P12 citations91
US8118618B2Feb 21, 2012
Apparatus for testing electronic devices
RICHMOND II DONALD P13 citations91
LINDSEY SCOTT E
3 patentsUS9250291B2Feb 2, 2016
System for testing an integrated circuit of a device and its method of use
LINDSEY SCOTT E19 citations92
US8228085B2Jul 24, 2012
System for testing an integrated circuit of a device and its method of use
LINDSEY SCOTT E26 citations92
US8947116B2Feb 3, 2015
System for testing an integrated circuit of a device and its method of use
LINDSEY SCOTT E22 citations90
AEHR Test Ststems
1 patentShowing the top 50 of 58 patents by PatentIndex Score.