Inventor
LIN LIANG-CHEN
TW23 patents
⚠️ This page may combine multiple inventors who share the name “LIN LIANG-CHEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
10 patentsUS11315860B2Apr 26, 2022
Semiconductor package and manufacturing process thereof
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations80
US11164825B2Nov 2, 2021
CoWos interposer with selectable/programmable capacitance arrays
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US10495687B2Dec 3, 2019
Reliability testing method
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations70
US10014252B2Jul 3, 2018
Integrated circuit with multi-level arrangement of e-fuse protected decoupling capacitors
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations70
US12283589B2Apr 22, 2025
Semiconductor device including cumulative sealing structures
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11676958B2Jun 13, 2023
Semiconductor device including cumulative sealing structures and method and system for making of same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11742276B2Aug 29, 2023
Semiconductor package and manufacturing process thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations59
US11226363B2Jan 18, 2022
Reliability testing method and apparatus
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations59
US10847492B2Nov 24, 2020
Semiconductor structure and manufacturing method for the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations48
US9711474B2Jul 18, 2017
Semiconductor package structure with polymeric layer and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations38
TAIWAN SEMICONDUCTOR MFG
7 patentsUS7719122B2May 18, 2010
System-in-package packaging for minimizing bond wire contamination and yield loss
TAIWAN SEMICONDUCTOR MFG72 citations96
US7397127B2Jul 8, 2008
Bonding and probing pad structures
TAIWAN SEMICONDUCTOR MFG19 citations92
US9385079B2Jul 5, 2016
Methods for forming stacked capacitors with fuse protection
TAIWAN SEMICONDUCTOR MFG14 citations81
US7843058B2Nov 30, 2010
Flip chip packages with spacers separating heat sinks and substrates
TAIWAN SEMICONDUCTOR MFG6 citations73
US7679180B2Mar 16, 2010
Bond pad design to minimize dielectric cracking
TAIWAN SEMICONDUCTOR MFG6 citations61
US7939824B2May 10, 2011
Test structure
TAIWAN SEMICONDUCTOR MFG2 citations60
US7498680B2Mar 3, 2009
Test structure
TAIWAN SEMICONDUCTOR MFG1 citations49