Inventor

JENKINS KEITH A

US66 patents

⚠️ This page may combine multiple inventors who share the name “JENKINS KEITH A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

JENKINS KEITH A

IBM

Apparatus and method for thermal isolation, circuit cooling and electromagnetic shielding of a wafer

Disposable built-in self-test devices, systems and methods for testing three dimensional integrated circuits

On-chip power supply noise detector

On chip temperature measuring and monitoring circuit and method

On-chip ground plane for semiconductor devices to reduce parasitic signal propagation

Carbon nanotube array for cryptographic key generation and protection

On chip temperature measuring and monitoring circuit and method

On-chip power supply noise detector

On-chip jitter measurement circuit

Electronic circuit for measurement of transistor variability and the like

BTI degradation test circuit

Analytics to determine customer satisfaction

Electromigration wearout detection circuits

On-chip combined hot carrier injection and bias temperature instability monitor

On-chip leakage measurement

Test circuit to isolate HCI degradation

Remote sensing using pulse-width modulation

Simultaneously measuring degradation in multiple FETs

Programmable jitter signal generator

Non-destructive analysis to determine use history of processor

Circuit to detect previous use of computer chips using passive test wires

Method and apparatus for determining phase locked loop jitter

Measuring individual device degradation in CMOS circuits

Duty cycle measurement

Analytics to determine customer satisfaction

Measuring individual device degradation in CMOS circuits

Electronic circuit for measurement of transistor variability and the like

On chip temperature measuring and monitoring circuit and method

On chip temperature measuring and monitoring method

Methods of operating an electronic circuit for measurement of transistor variability and the like

On chip temperature measuring and monitoring method

Electrical component tuned by conductive layer deletion

System and method for determining a delay time interval of components

Integrated CMOS spectrum analyzer for on-chip diagnostics using digital autocorrelation of coarsely quantized signals

Remote monitoring of software

On-chip jitter measurement circuit

Dielectric breakdown monitor

Autonomic supply voltage compensation for degradation of circuits over circuit lifetime

Degradation monitoring of semiconductor chips

Dynamic predictor of semiconductor lifetime limits

Ring oscillator structures to determine local voltage value

Touch movement activation for gaining access beyond a restricted access gateway

On-chip combined hot carrier injection and bias temperature instability monitor

Measurement for transistor output characteristics with and without self heating

Touch movement activation for gaining access beyond a restricted access gateway

Remote sensing using pulse-width modulation

Test structure to measure delay variability mismatch of digital logic paths

JENKINS KEITH A

Self-aligned graphene transistor

High frequency oscillator circuit and method to operate same

High frequency oscillator circuit