Inventor
ISHIBA MASATO
JP5 patents
Patents
5 patentsUS7394084B2Jul 1, 2008
Method of generating image and illumination device for inspecting substrate
OMRON TATEISI ELECTRONICS CO20 citations90
US7505149B2Mar 17, 2009
Apparatus for surface inspection and method and apparatus for inspecting substrate
OMRON TATEISI ELECTRONICS CO9 citations81
US7310406B2Dec 18, 2007
Inspection method and system for and method of producing component mounting substrate
OMRON TATEISI ELECTRONICS CO8 citations71
US7680320B2Mar 16, 2010
Image processing method, substrate inspection method, substrate inspection apparatus and method of generating substrate inspection data
OMRON TATEISI ELECTRONICS CO2 citations60
US7869644B2Jan 11, 2011
Methods of and apparatus for inspecting substrate
OMRON TATEISI ELECTRONICS CO1 citations49