Inventor
YOTSUYA TERUHISA
JP11 patents
Patents
11 patentsUS5245671ASep 14, 1993
Apparatus for inspecting printed circuit boards and the like, and method of operating same
OMRON TATEISI ELECTRONICS CO103 citations95
US4894790AJan 16, 1990
Input method for reference printed circuit board assembly data to an image processing printed circuit board assembly automatic inspection apparatus
OMRON TATEISI ELECTRONICS CO83 citations95
US5093797AMar 3, 1992
Apparatus for inspecting packaged electronic device
OMRON TATEISI ELECTRONICS CO24 citations92
US5027295AJun 25, 1991
Apparatus for inspecting packaged electronic device
OMRON TATEISI ELECTRONICS CO37 citations92
US4953100AAug 28, 1990
Apparatus for inspecting packaged electronic device
OMRON TATEISI ELECTRONICS CO29 citations92
US7394084B2Jul 1, 2008
Method of generating image and illumination device for inspecting substrate
OMRON TATEISI ELECTRONICS CO20 citations90
US7505149B2Mar 17, 2009
Apparatus for surface inspection and method and apparatus for inspecting substrate
OMRON TATEISI ELECTRONICS CO9 citations81
US7310406B2Dec 18, 2007
Inspection method and system for and method of producing component mounting substrate
OMRON TATEISI ELECTRONICS CO8 citations71
US7512260B2Mar 31, 2009
Substrate inspection method and apparatus
OMRON TATEISI ELECTRONICS CO5 citations62
US7680320B2Mar 16, 2010
Image processing method, substrate inspection method, substrate inspection apparatus and method of generating substrate inspection data
OMRON TATEISI ELECTRONICS CO2 citations60
US7869644B2Jan 11, 2011
Methods of and apparatus for inspecting substrate
OMRON TATEISI ELECTRONICS CO1 citations49