Inventor
KANG KI-SANG
KR13 patents
⚠️ This page may combine multiple inventors who share the name “KANG KI-SANG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
12 patentsUS6642729B2Nov 4, 2003
Probe card for tester head
SAMSUNG ELECTRONICS CO LTD17 citations83
US7838790B2Nov 23, 2010
Multifunctional handler system for electrical testing of semiconductor devices
SAMSUNG ELECTRONICS CO LTD11 citations82
US7554349B2Jun 30, 2009
Handlers for testing semiconductor devices that are capable of maintaining stable temperature in test environments
SAMSUNG ELECTRONICS CO LTD16 citations82
US6625766B1Sep 23, 2003
Tester of semiconductor memory device and test method thereof
SAMSUNG ELECTRONICS CO LTD14 citations82
US6288955B1Sep 11, 2001
Methods and systems for testing integrated circuit memory devices by overlappiing test result loading and test result analysis
SAMSUNG ELECTRONICS CO LTD16 citations80
US7103493B2Sep 5, 2006
Memory testing apparatus and method
SAMSUNG ELECTRONICS CO LTD7 citations73
US7633288B2Dec 15, 2009
Method of testing semiconductor devices and handler used for testing semiconductor devices
SAMSUNG ELECTRONICS CO LTD7 citations72
US6445172B1Sep 3, 2002
Wafer probing system and method of calibrating wafer probing needle using the same
SAMSUNG ELECTRONICS CO LTD9 citations71
US6972612B2Dec 6, 2005
Semiconductor device with malfunction control circuit and controlling method thereof
SAMSUNG ELECTRONICS CO LTD2 citations62
US6507801B1Jan 14, 2003
Semiconductor device testing system
SAMSUNG ELECTRONICS CO LTD6 citations62
US7886206B2Feb 8, 2011
Semiconductor memory test device and method thereof
SAMSUNG ELECTRONICS CO LTD3 citations61
US7533310B2May 12, 2009
Semiconductor memory test device and method thereof
SAMSUNG ELECTRONICS CO LTD1 citations51