Inventor
SHIM HYUN-SEOP
KR14 patents
⚠️ This page may combine multiple inventors who share the name “SHIM HYUN-SEOP”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
10 patentsUS5959915ASep 28, 1999
Test method of integrated circuit devices by using a dual edge clock technique
SAMSUNG ELECTRONICS CO LTD25 citations89
US7838790B2Nov 23, 2010
Multifunctional handler system for electrical testing of semiconductor devices
SAMSUNG ELECTRONICS CO LTD11 citations82
US7554349B2Jun 30, 2009
Handlers for testing semiconductor devices that are capable of maintaining stable temperature in test environments
SAMSUNG ELECTRONICS CO LTD16 citations82
US7084655B2Aug 1, 2006
Burn-in test apparatus for BGA packages using forced heat exhaust
SAMSUNG ELECTRONICS CO LTD15 citations82
US7438563B2Oct 21, 2008
Connector for testing a semiconductor package
SAMSUNG ELECTRONICS CO LTD9 citations80
US7227351B2Jun 5, 2007
Apparatus and method for performing parallel test on integrated circuit devices
SAMSUNG ELECTRONICS CO LTD11 citations80
US6201746B1Mar 13, 2001
Test method for high speed memory devices in which limit conditions for the clock are defined
SAMSUNG ELECTRONICS CO LTD9 citations71
US6943577B2Sep 13, 2005
Multichip package test
SAMSUNG ELECTRONICS CO LTD6 citations70
US7017428B2Mar 28, 2006
Test kit for semiconductor package and method for testing semiconductor package using the same
SAMSUNG ELECTRONICS CO LTD5 citations61
US7327154B2Feb 5, 2008
Multichip package test
SAMSUNG ELECTRONICS CO LTD3 citations59