Inventor
WU XIAOJU
US47 patents
⚠️ This page may combine multiple inventors who share the name “WU XIAOJU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TEXAS INSTRUMENTS INC
41 patentsUS6730962B2May 4, 2004
Method of manufacturing and structure of semiconductor device with field oxide structure
TEXAS INSTRUMENTS INC27 citations92
US7598547B2Oct 6, 2009
Low noise vertical variable gate control voltage JFET device in a BiCMOS process and methods to build this device
TEXAS INSTRUMENTS INC18 citations88
US7018880B2Mar 28, 2006
Method for manufacturing a MOS transistor having reduced 1/f noise
TEXAS INSTRUMENTS INC26 citations88
US10461182B1Oct 29, 2019
Drain centered LDMOS transistor with integrated dummy patterns
TEXAS INSTRUMENTS INC16 citations84
US9099523B2Aug 4, 2015
ESD protection circuit with isolated SCR for negative voltage operation
TEXAS INSTRUMENTS INC6 citations84
US7348228B2Mar 25, 2008
Deep buried channel junction field effect transistor (DBCJFET)
TEXAS INSTRUMENTS INC17 citations84
US7919368B2Apr 5, 2011
Area-efficient electrically erasable programmable memory cell
TEXAS INSTRUMENTS INC13 citations83
US7893768B2Feb 22, 2011
Automatic gain control
TEXAS INSTRUMENTS INC17 citations83
US7402874B2Jul 22, 2008
One time programmable EPROM fabrication in STI CMOS technology
TEXAS INSTRUMENTS INC7 citations74
US6790736B2Sep 14, 2004
Method for manufacturing and structure of semiconductor device with polysilicon definition structure
TEXAS INSTRUMENTS INC6 citations74
US11094817B2Aug 17, 2021
Drain extended NMOS transistor
TEXAS INSTRUMENTS INC3 citations70
US10580890B2Mar 3, 2020
Drain extended NMOS transistor
TEXAS INSTRUMENTS INC2 citations70
US11152505B2Oct 19, 2021
Drain extended transistor
TEXAS INSTRUMENTS INC2 citations68
US7164160B2Jan 16, 2007
Integrated circuit device with a vertical JFET
TEXAS INSTRUMENTS INC3 citations63
US6870242B2Mar 22, 2005
Method for manufacturing and structure of semiconductor device with polysilicon definition structure
TEXAS INSTRUMENTS INC3 citations63
US12057443B2Aug 6, 2024
ESD protection circuit with isolated SCR for negative voltage operation
TEXAS INSTRUMENTS INC0 citations62
US11302688B2Apr 12, 2022
ESD protection circuit with isolated SCR for negative voltage operation
TEXAS INSTRUMENTS INC0 citations62
US11049852B2Jun 29, 2021
ESD protection circuit with isolated SCR for negative voltage operation
TEXAS INSTRUMENTS INC0 citations62
US7785906B2Aug 31, 2010
Method to detect poly residues in LOCOS process
TEXAS INSTRUMENTS INC2 citations62
US7307309B2Dec 11, 2007
EEPROM with etched tunneling window
TEXAS INSTRUMENTS INC4 citations62
US7244651B2Jul 17, 2007
Fabrication of an OTP-EPROM having reduced leakage current
TEXAS INSTRUMENTS INC6 citations62
US11916067B2Feb 27, 2024
High reliability polysilicon components
TEXAS INSTRUMENTS INC0 citations61
US11296075B2Apr 5, 2022
High reliability polysilicon components
TEXAS INSTRUMENTS INC1 citations61
US6885054B1Apr 26, 2005
Threshold voltage stabilizer, method of manufacturing and integrated circuit employing the same
TEXAS INSTRUMENTS INC2 citations61
US7745274B2Jun 29, 2010
Gate self aligned low noise JFET
TEXAS INSTRUMENTS INC2 citations57
US11374124B2Jun 28, 2022
Protection of drain extended transistor field oxide
TEXAS INSTRUMENTS INC0 citations52
US10505037B2Dec 10, 2019
P-channel DEMOS device
TEXAS INSTRUMENTS INC0 citations52
US10347732B1Jul 9, 2019
Semiconductor device with extended electrically-safe operating area
TEXAS INSTRUMENTS INC0 citations52
US10326014B2Jun 18, 2019
Semiconductor device with extended electrically-safe operating area
TEXAS INSTRUMENTS INC0 citations52
US10083951B2Sep 25, 2018
ESD protection circuit with isolated SCR for negative voltage operation
TEXAS INSTRUMENTS INC0 citations52
US10014405B1Jul 3, 2018
Semiconductor device with extended electrically-safe operating area
TEXAS INSTRUMENTS INC0 citations52
US9947783B2Apr 17, 2018
P-channel DEMOS device
TEXAS INSTRUMENTS INC0 citations52
US7457173B2Nov 25, 2008
Area efficient differential EEPROM cell with improved data retention and read/write endurance
TEXAS INSTRUMENTS INC0 citations52
US6921701B2Jul 26, 2005
Method of manufacturing and structure of semiconductor device (DEMOS) with field oxide structure
TEXAS INSTRUMENTS INC0 citations52
US10879387B2Dec 29, 2020
Drain centered LDMOS transistor with integrated dummy patterns
TEXAS INSTRUMENTS INC0 citations51
US10090299B2Oct 2, 2018
MOSFET transistors with robust subthreshold operations
TEXAS INSTRUMENTS INC0 citations50
US9899376B2Feb 20, 2018
MOSFET transistors with robust subthreshold operations
TEXAS INSTRUMENTS INC0 citations50
US7112953B2Sep 26, 2006
Method for detecting epitaxial (EPI) induced buried layer shifts in semiconductor devices
TEXAS INSTRUMENTS INC1 citations50
US12199091B2Jan 14, 2025
Shallow trench isolation processing with local oxidation of silicon
TEXAS INSTRUMENTS INC0 citations44
US7687856B2Mar 30, 2010
Body bias to facilitate transistor matching
TEXAS INSTRUMENTS INC0 citations37
US10498326B2Dec 3, 2019
Output driver with power down protection
TEXAS INSTRUMENTS INC0 citations34