Inventor
JANG SUNGHO
KR26 patents
⚠️ This page may combine multiple inventors who share the name “JANG SUNGHO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
21 patentsUS9305928B2Apr 5, 2016
Semiconductor devices having a silicon-germanium channel layer and methods of forming the same
SAMSUNG ELECTRONICS CO LTD11 citations79
US12347096B2Jul 1, 2025
Semiconductor measurement apparatus
SAMSUNG ELECTRONICS CO LTD2 citations73
US10332890B2Jun 25, 2019
Semiconductor memory device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD2 citations71
US9595315B2Mar 14, 2017
Semiconductor memory device compensating difference of bitline interconnection resistance
SAMSUNG ELECTRONICS CO LTD6 citations71
US9947668B2Apr 17, 2018
Semiconductor devices and methods of forming the same
SAMSUNG ELECTRONICS CO LTD4 citations69
US11521977B2Dec 6, 2022
Semiconductor memory device
SAMSUNG ELECTRONICS CO LTD0 citations60
US11437089B2Sep 6, 2022
Integrated circuit devices
SAMSUNG ELECTRONICS CO LTD1 citations59
US12560532B2Feb 24, 2026
Apparatus for measuring radical density distribution based on light absorption and operating method thereof
SAMSUNG ELECTRONICS CO LTD0 citations57
US12538733B2Jan 27, 2026
Stealth dicing laser device
SAMSUNG ELECTRONICS CO LTD0 citations57
US11490499B2Nov 1, 2022
Method of exposure using extreme ultraviolet and method of manufacturing a semiconductor device using the same
SAMSUNG ELECTRONICS CO LTD1 citations57
US11676263B2Jun 13, 2023
Extreme ultraviolet (EUV) collector inspection apparatus and method
SAMSUNG ELECTRONICS CO LTD0 citations54
US11016400B1May 25, 2021
Extreme ultraviolet exposure system
SAMSUNG ELECTRONICS CO LTD0 citations50
US12455228B2Oct 28, 2025
Semiconductor measurement apparatus
SAMSUNG ELECTRONICS CO LTD0 citations48
US12313393B2May 27, 2025
Level sensor and substrate processing apparatus including the same
SAMSUNG ELECTRONICS CO LTD0 citations47
US12557587B2Feb 17, 2026
Apparatus and method monitoring semiconductor manufacturing equipment
SAMSUNG ELECTRONICS CO LTD0 citations46
US12422245B2Sep 23, 2025
Semiconductor measurement apparatus
SAMSUNG ELECTRONICS CO LTD0 citations46
US12494352B2Dec 9, 2025
Plasma confinement ring, semiconductor manufacturing apparatus including the same, and method of manufacturing a semiconductor device using the same
SAMSUNG ELECTRONICS CO LTD0 citations45
US11898912B2Feb 13, 2024
Hyperspectral imaging (HSI) apparatus and inspection apparatus including the same
SAMSUNG ELECTRONICS CO LTD0 citations45
US12431341B2Sep 30, 2025
Apparatus for arcing diagnosis, plasma process equipment including the same, and arcing diagnosis method
SAMSUNG ELECTRONICS CO LTD0 citations44
US10871396B2Dec 22, 2020
Optical emission spectroscopy calibration device and system including the same
SAMSUNG ELECTRONICS CO LTD0 citations41
US10732129B2Aug 4, 2020
Apparatus for and method of performing inspection and metrology process
SAMSUNG ELECTRONICS CO LTD0 citations39