Inventor
KROKHMAL ALEXANDER
IL15 patents
⚠️ This page may combine multiple inventors who share the name “KROKHMAL ALEXANDER”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
BRUKER TECH LTD
7 patentsUS11181490B2Nov 23, 2021
Small-angle x-ray scatterometry
BRUKER TECH LTD10 citations83
US11781999B2Oct 10, 2023
Spot-size control in reflection-based and scatterometry-based X-ray metrology systems
BRUKER TECH LTD1 citations61
US11302508B2Apr 12, 2022
X-ray tube
BRUKER TECH LTD0 citations61
US12085521B2Sep 10, 2024
Small-angle X-ray scatterometry
BRUKER TECH LTD0 citations60
US11703464B2Jul 18, 2023
Small-angle x-ray scatterometry
BRUKER TECH LTD0 citations60
US12249059B2Mar 11, 2025
Navigation accuracy using camera coupled with detector assembly
BRUKER TECH LTD0 citations58
US12078604B2Sep 3, 2024
Monitoring properties of X-ray beam during X-ray analysis
BRUKER TECH LTD0 citations50
JORDAN VALLEY SEMICONDUCTORS
4 patentsUS7551719B2Jun 23, 2009
Multifunction X-ray analysis system
JORDAN VALLEY SEMICONDUCTORS120 citations98
US7680243B2Mar 16, 2010
X-ray measurement of properties of nano-particles
JORDAN VALLEY SEMICONDUCTORS55 citations95
US7600916B2Oct 13, 2009
Target alignment for X-ray scattering measurements
JORDAN VALLEY SEMICONDUCTORS21 citations92
US7321652B2Jan 22, 2008
Multi-detector EDXRD
JORDAN VALLEY SEMICONDUCTORS4 citations61
BRUKER JV ISRAEL LTD
3 patentsUS10976270B2Apr 13, 2021
X-ray detection optics for small-angle X-ray scatterometry
BRUKER JV ISRAEL LTD23 citations93
US10976268B2Apr 13, 2021
X-ray source optics for small-angle X-ray scatterometry
BRUKER JV ISRAEL LTD2 citations71
US10976269B2Apr 13, 2021
Wafer alignment for small-angle x-ray scatterometry
BRUKER JV ISRAEL LTD1 citations68