Inventor
SUN YANGYANG
US33 patents
⚠️ This page may combine multiple inventors who share the name “SUN YANGYANG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
APPLIED MATERIALS INC
13 patentsUS12019242B2Jun 25, 2024
Full-field metrology tool for waveguide combiners and meta-surfaces
APPLIED MATERIALS INC2 citations73
US12379280B2Aug 5, 2025
Method of measuring efficiency for optical devices
APPLIED MATERIALS INC0 citations62
US12236575B2Feb 25, 2025
In-line metrology systems, apparatus, and methods for optical devices
APPLIED MATERIALS INC0 citations62
US12229940B2Feb 18, 2025
In-line metrology systems, apparatus, and methods for optical devices
APPLIED MATERIALS INC0 citations62
US12203747B2Jan 21, 2025
Interference in-sensitive Littrow system for optical device structure measurement
APPLIED MATERIALS INC0 citations62
US11978196B2May 7, 2024
See-through metrology systems, apparatus, and methods for optical devices
APPLIED MATERIALS INC0 citations62
US11913776B2Feb 27, 2024
Interference in-sensitive Littrow system for optical device structure measurement
APPLIED MATERIALS INC0 citations62
US11748875B2Sep 5, 2023
See-through metrology systems, apparatus, and methods for optical devices
APPLIED MATERIALS INC0 citations62
US12386155B2Aug 12, 2025
Ultra-wide angle lens systems with external pupil
APPLIED MATERIALS INC0 citations58
US12398998B2Aug 26, 2025
Methods for high-resolution, stable measurement of pitch and orientation in optical gratings
APPLIED MATERIALS INC0 citations52
US12165341B2Dec 10, 2024
Optical resolution measurement method for optical devices
APPLIED MATERIALS INC0 citations52
US11988574B2May 21, 2024
Illumination system for AR metrology tool
APPLIED MATERIALS INC0 citations52
US12560510B2Feb 24, 2026
Methods of geometry parameters measurement for optical gratings
APPLIED MATERIALS INC0 citations46
QUALCOMM INC
13 patentsUS11417622B2Aug 16, 2022
Flip-chip device
QUALCOMM INC0 citations62
US11380613B2Jul 5, 2022
Repurposed seed layer for high frequency noise control and electrostatic discharge connection
QUALCOMM INC0 citations62
US12113038B2Oct 8, 2024
Thermal compression flip chip bump for high performance and fine pitch
QUALCOMM INC0 citations61
US11948909B2Apr 2, 2024
Package comprising spacers between integrated devices
QUALCOMM INC1 citations61
US11557557B2Jan 17, 2023
Flip-chip flexible under bump metallization size
QUALCOMM INC1 citations61
US10325979B1Jun 18, 2019
High density and reliable vertical natural capacitors
QUALCOMM INC0 citations52
US12525574B2Jan 13, 2026
Three-dimensional (3D) integrated circuit (IC) (3DIC) package with a bottom die layer employing an extended interposer substrate, and related fabrication methods
QUALCOMM INC0 citations51
US12500187B2Dec 16, 2025
Package comprising an interconnection die located between substrates
QUALCOMM INC0 citations51
US12500188B2Dec 16, 2025
Flip-chip bumping metal layer and bump structure
QUALCOMM INC0 citations51
US12469811B2Nov 11, 2025
Package comprising wire bonds coupled to integrated devices
QUALCOMM INC0 citations51
US12463127B2Nov 4, 2025
Integrated circuit (IC) package employing a re-distribution layer (RDL) substrate(s) with photosensitive dielectric layer(s) for increased package rigidity, and related fabrication methods
QUALCOMM INC0 citations51
US11676922B2Jun 13, 2023
Integrated device comprising interconnect structures having an inner interconnect, a dielectric layer and a conductive layer
QUALCOMM INC0 citations51
US12355000B2Jul 8, 2025
Package comprising a substrate and a high-density interconnect integrated device
QUALCOMM INC0 citations46