P

Inventor

SUN YANGYANG

US33 patents
⚠️ This page may combine multiple inventors who share the name “SUN YANGYANG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

APPLIED MATERIALS INC

13 patents
US12019242B2Jun 25, 2024

Full-field metrology tool for waveguide combiners and meta-surfaces

APPLIED MATERIALS INC2 citations73
US12379280B2Aug 5, 2025

Method of measuring efficiency for optical devices

APPLIED MATERIALS INC0 citations62
US12236575B2Feb 25, 2025

In-line metrology systems, apparatus, and methods for optical devices

APPLIED MATERIALS INC0 citations62
US12229940B2Feb 18, 2025

In-line metrology systems, apparatus, and methods for optical devices

APPLIED MATERIALS INC0 citations62
US12203747B2Jan 21, 2025

Interference in-sensitive Littrow system for optical device structure measurement

APPLIED MATERIALS INC0 citations62
US11978196B2May 7, 2024

See-through metrology systems, apparatus, and methods for optical devices

APPLIED MATERIALS INC0 citations62
US11913776B2Feb 27, 2024

Interference in-sensitive Littrow system for optical device structure measurement

APPLIED MATERIALS INC0 citations62
US11748875B2Sep 5, 2023

See-through metrology systems, apparatus, and methods for optical devices

APPLIED MATERIALS INC0 citations62
US12386155B2Aug 12, 2025

Ultra-wide angle lens systems with external pupil

APPLIED MATERIALS INC0 citations58
US12398998B2Aug 26, 2025

Methods for high-resolution, stable measurement of pitch and orientation in optical gratings

APPLIED MATERIALS INC0 citations52
US12165341B2Dec 10, 2024

Optical resolution measurement method for optical devices

APPLIED MATERIALS INC0 citations52
US11988574B2May 21, 2024

Illumination system for AR metrology tool

APPLIED MATERIALS INC0 citations52
US12560510B2Feb 24, 2026

Methods of geometry parameters measurement for optical gratings

APPLIED MATERIALS INC0 citations46

QUALCOMM INC

13 patents
US11417622B2Aug 16, 2022

Flip-chip device

QUALCOMM INC0 citations62
US11380613B2Jul 5, 2022

Repurposed seed layer for high frequency noise control and electrostatic discharge connection

QUALCOMM INC0 citations62
US12113038B2Oct 8, 2024

Thermal compression flip chip bump for high performance and fine pitch

QUALCOMM INC0 citations61
US11948909B2Apr 2, 2024

Package comprising spacers between integrated devices

QUALCOMM INC1 citations61
US11557557B2Jan 17, 2023

Flip-chip flexible under bump metallization size

QUALCOMM INC1 citations61
US10325979B1Jun 18, 2019

High density and reliable vertical natural capacitors

QUALCOMM INC0 citations52
US12525574B2Jan 13, 2026

Three-dimensional (3D) integrated circuit (IC) (3DIC) package with a bottom die layer employing an extended interposer substrate, and related fabrication methods

QUALCOMM INC0 citations51
US12500187B2Dec 16, 2025

Package comprising an interconnection die located between substrates

QUALCOMM INC0 citations51
US12500188B2Dec 16, 2025

Flip-chip bumping metal layer and bump structure

QUALCOMM INC0 citations51
US12469811B2Nov 11, 2025

Package comprising wire bonds coupled to integrated devices

QUALCOMM INC0 citations51
US12463127B2Nov 4, 2025

Integrated circuit (IC) package employing a re-distribution layer (RDL) substrate(s) with photosensitive dielectric layer(s) for increased package rigidity, and related fabrication methods

QUALCOMM INC0 citations51
US11676922B2Jun 13, 2023

Integrated device comprising interconnect structures having an inner interconnect, a dielectric layer and a conductive layer

QUALCOMM INC0 citations51
US12355000B2Jul 8, 2025

Package comprising a substrate and a high-density interconnect integrated device

QUALCOMM INC0 citations46

GANDHI JASPREET S

2 patents

SUN YANGYANG

1 patent

UNIV CENTRAL FLORIDA RES FOUND INC

1 patent

MICRON TECHNOLOGY INC

1 patent

CHINA CONSTRUCTION STEEL STRUCTURE CORP LTD

1 patent

QINGDAO SHENGHAN CHROMATOGRAPH TECH CO LTD

1 patent