Inventor

LANGE JOACHIM

DE14 patents

⚠️ This page may combine multiple inventors who share the name “LANGE JOACHIM”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

BRUKER AXS GMBH

4 patents

US7295650B2Nov 13, 2007

Method for operating a primary beam stop

BRUKER AXS GMBH11 citations80

US6898270B2May 24, 2005

X-ray optical system with collimator in the focus of an X-ray mirror

BRUKER AXS GMBH14 citations77

US6925147B2Aug 2, 2005

X-ray optical system and method for imaging a source

BRUKER AXS GMBH3 citations60

US7852983B2Dec 14, 2010

X-ray diffractometer for mechanically correlated movement of the source, detector, and sample position

BRUKER AXS GMBH3 citations53

THOMSON BRANDT GMBH

3 patents

US4590611AMay 20, 1986

Tuner for communications equipment

THOMSON BRANDT GMBH27 citations92

US4604571AAug 5, 1986

Circuit for the determination of voltage extrema

THOMSON BRANDT GMBH3 citations62

US5561403AOct 1, 1996

Oscillator and modulator arrangements on a circuit board

THOMSON BRANDT GMBH0 citations51

PHILIPS CORP

2 patents

US6064866AMay 16, 2000

Switchable bandpass filter for a multiband tuner

PHILIPS CORP27 citations92

US6094360AJul 25, 2000

HF module with housing and printed circuit board arranged therein

PHILIPS CORP14 citations67

ROLLI KILIAN

1 patent

USD667381SSep 18, 2012

Controller for an electronic device

ROLLI KILIAN30 citations89

DIDIER WERKE AG

1 patent

US4711432ADec 8, 1987

Gas washing device

DIDIER WERKE AG13 citations71

REIFENHAEUSER MASCH

1 patent

US5624689AApr 29, 1997

Foil blowing apparatus for thermoplastic synthetic resins

REIFENHAEUSER MASCH4 citations60

SCHIPPER ROLF

1 patent

US8867704B2Oct 21, 2014

Method for X-ray diffractometry analysis at differing wavelengths without exchanging the X-ray source

SCHIPPER ROLF2 citations54

MORELLE PHILIPPE

1 patent

US9353450B2May 31, 2016

Electrolyzer apparatus

MORELLE PHILIPPE0 citations40