Inventor
YUAN CHI
US15 patents
Patents
15 patentsUS10976361B2Apr 13, 2021
Automated test equipment (ATE) support framework for solid state device (SSD) odd sector sizes and protection modes
ADVANTEST CORP8 citations83
US12216559B2Feb 4, 2025
Systems and methods for parallel testing of multiple namespaces located in a plurality of devices under test
ADVANTEST CORP2 citations72
US12436855B2Oct 7, 2025
Systems and methods utilizing DAX memory management for testing CXL protocol enabled devices
ADVANTEST CORP0 citations60
US12360868B2Jul 15, 2025
CXL protocol enablement for test environment systems and methods
ADVANTEST CORP0 citations60
US12248390B2Mar 11, 2025
Lockless log and error reporting for automatic test equipment
ADVANTEST CORP0 citations60
US12197303B2Jan 14, 2025
Systems and methods for testing cxl enabled devices in parallel
ADVANTEST CORP0 citations60
US11899550B2Feb 13, 2024
Enhanced auxiliary memory mapped interface test systems and methods
ADVANTEST CORP0 citations60
US11650893B2May 16, 2023
Multiple name space test systems and methods
ADVANTEST CORP0 citations60
US12203978B2Jan 21, 2025
Flexible sideband support systems and methods
ADVANTEST CORP0 citations58
US11733290B2Aug 22, 2023
Flexible sideband support systems and methods
ADVANTEST CORP0 citations58
US12353306B2Jul 8, 2025
Management of hot add in a testing environment for DUTs that are CXL protocol enabled
ADVANTEST CORP0 citations56
US12332829B2Jun 17, 2025
Automatic test equipment architecture providing odd sector size support
ADVANTEST CORP0 citations50
US12320851B2Jun 3, 2025
Software and firmware support for device interface board configured to allow devices supporting multiple different standards to interface with the same socket
ADVANTEST CORP0 citations50
US12222844B2Feb 11, 2025
Systems and methods for testing virtual functions of a device under test
ADVANTEST CORP0 citations50
US10761138B2Sep 1, 2020
Low cost built-in-self-test centric testing
ADVANTEST CORP0 citations41