P

Inventor

LEE KWANG JIN

KR141 patents
⚠️ This page may combine multiple inventors who share the name “LEE KWANG JIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

36 patents
US7542356B2Jun 2, 2009

Semiconductor memory device and method for reducing cell activation during write operations

SAMSUNG ELECTRONICS CO LTD76 citations98
US7529124B2May 5, 2009

Phase change memory devices and systems, and related programming methods

SAMSUNG ELECTRONICS CO LTD77 citations98
US7349245B2Mar 25, 2008

Non-volatile phase-change memory device and associated program-suspend-read operation

SAMSUNG ELECTRONICS CO LTD55 citations98
US6307424B1Oct 23, 2001

Programmable impedance control output circuit and programmable impedance control method thereof in semiconductor device

SAMSUNG ELECTRONICS CO LTD92 citations98
US8050084B2Nov 1, 2011

Nonvolatile memory device, storage system having the same, and method of driving the nonvolatile memory device

SAMSUNG ELECTRONICS CO LTD42 citations93
US7535747B2May 19, 2009

Phase change random access memory and related methods of operation

SAMSUNG ELECTRONICS CO LTD21 citations93
US7283387B2Oct 16, 2007

Phase change random access memory device having variable drive voltage circuit

SAMSUNG ELECTRONICS CO LTD44 citations93
US6459652B1Oct 1, 2002

Semiconductor memory device having echo clock path

SAMSUNG ELECTRONICS CO LTD21 citations93
US7522449B2Apr 21, 2009

Phase change memory device and related programming method

SAMSUNG ELECTRONICS CO LTD35 citations92
US7486536B2Feb 3, 2009

Phase-changeable memory device and method of programming the same

SAMSUNG ELECTRONICS CO LTD31 citations92
US6594818B2Jul 15, 2003

Memory architecture permitting selection of storage density after fabrication of active circuitry

SAMSUNG ELECTRONICS CO LTD34 citations92
US6507224B1Jan 14, 2003

High speed input receiver for generating pulse signal

SAMSUNG ELECTRONICS CO LTD24 citations92
US7746688B2Jun 29, 2010

PRAM and method of firing memory cells

SAMSUNG ELECTRONICS CO LTD20 citations91
US6901014B2May 31, 2005

Circuits and methods for screening for defective memory cells in semiconductor memory devices

SAMSUNG ELECTRONICS CO LTD47 citations90
US7978539B2Jul 12, 2011

Semiconductor device having resistance based memory array, method of reading, and systems associated therewith

SAMSUNG ELECTRONICS CO LTD10 citations84
US7952956B2May 31, 2011

Variable resistance memory device and system

SAMSUNG ELECTRONICS CO LTD15 citations84
US7949928B2May 24, 2011

Semiconductor memory device and data error detection and correction method of the same

SAMSUNG ELECTRONICS CO LTD10 citations84
US7881145B2Feb 1, 2011

Semiconductor device and semiconductor system having the same

SAMSUNG ELECTRONICS CO LTD14 citations84
US7688620B2Mar 30, 2010

Nonvolatile memory device and related methods of operation

SAMSUNG ELECTRONICS CO LTD10 citations84
US7580295B2Aug 25, 2009

Semiconductor memory device and memory system including semiconductor memory device

SAMSUNG ELECTRONICS CO LTD8 citations84
US7548467B2Jun 16, 2009

Bias voltage generator and method generating bias voltage for semiconductor memory device

SAMSUNG ELECTRONICS CO LTD14 citations84
US7471553B2Dec 30, 2008

Phase change memory device and program method thereof

SAMSUNG ELECTRONICS CO LTD10 citations84
US7457152B2Nov 25, 2008

Non-volatile memory devices and systems including phase-change one-time-programmable (OTP) memory cells and related methods

SAMSUNG ELECTRONICS CO LTD12 citations84
US6933758B2Aug 23, 2005

Synchronous mirror delay circuit with adjustable locking range

SAMSUNG ELECTRONICS CO LTD14 citations84
US6617894B2Sep 9, 2003

Circuits and methods for generating internal clock signal of intermediate phase relative to external clock

SAMSUNG ELECTRONICS CO LTD16 citations84
US6583647B2Jun 24, 2003

Signal converting system having level converter for use in high speed semiconductor device and method therefor

SAMSUNG ELECTRONICS CO LTD13 citations84
US11003382B2May 11, 2021

Apparatus for outputting internal state of memory apparatus and memory system using the apparatus

SAMSUNG ELECTRONICS CO LTD7 citations83
US6785173B2Aug 31, 2004

Semiconductor memory device capable of performing high-frequency wafer test operation

SAMSUNG ELECTRONICS CO LTD13 citations82
US6166969ADec 26, 2000

Method and apparatus for a level shifter for use in a semiconductor memory device

SAMSUNG ELECTRONICS CO LTD17 citations81
US7920432B2Apr 5, 2011

Semiconductor device having resistance based memory array, method of reading, and systems associated therewith

SAMSUNG ELECTRONICS CO LTD6 citations74
US7894277B2Feb 22, 2011

Semiconductor device having resistance based memory array, method of reading and writing, and systems associated therewith

SAMSUNG ELECTRONICS CO LTD6 citations74
US7751232B2Jul 6, 2010

Method of testing PRAM device

SAMSUNG ELECTRONICS CO LTD7 citations74
US6834366B2Dec 21, 2004

Method of outputting internal information through test pin of semiconductor memory and output circuit thereof

SAMSUNG ELECTRONICS CO LTD10 citations74
US10644069B2May 5, 2020

Memory devices having crosspoint memory arrays therein with multi-level word line and bit line structures

SAMSUNG ELECTRONICS CO LTD6 citations73
US9952789B2Apr 24, 2018

Memory systems and electronic devices including nonvolatile memory modules

SAMSUNG ELECTRONICS CO LTD2 citations73
US9799399B2Oct 24, 2017

Nonvolatile memory devices including controller for operating nonvolatile memory cell array layer in memory chip in one of memory mode and storage mode

SAMSUNG ELECTRONICS CO LTD4 citations73

CHO WOO-YEONG

4 patents

LG CHEMICAL LTD

2 patents

BAE JUN-SOO

1 patent

CHOI BYUNG-GIL

1 patent

HYUNDAI ELECTRONICS IND

1 patent

LEE KWANG JIN

1 patent

LEE KWANG-JIN

1 patent

KOLON INC

1 patent

SAMSUNG ELECTRONCIS CO LTD

1 patent

LEE YONG-JUN

1 patent

Showing the top 50 of 141 patents by PatentIndex Score.