Inventor
LEE KWANG JIN
KR141 patents
⚠️ This page may combine multiple inventors who share the name “LEE KWANG JIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
36 patentsUS7542356B2Jun 2, 2009
Semiconductor memory device and method for reducing cell activation during write operations
SAMSUNG ELECTRONICS CO LTD76 citations98
US7529124B2May 5, 2009
Phase change memory devices and systems, and related programming methods
SAMSUNG ELECTRONICS CO LTD77 citations98
US7349245B2Mar 25, 2008
Non-volatile phase-change memory device and associated program-suspend-read operation
SAMSUNG ELECTRONICS CO LTD55 citations98
US6307424B1Oct 23, 2001
Programmable impedance control output circuit and programmable impedance control method thereof in semiconductor device
SAMSUNG ELECTRONICS CO LTD92 citations98
US8050084B2Nov 1, 2011
Nonvolatile memory device, storage system having the same, and method of driving the nonvolatile memory device
SAMSUNG ELECTRONICS CO LTD42 citations93
US7535747B2May 19, 2009
Phase change random access memory and related methods of operation
SAMSUNG ELECTRONICS CO LTD21 citations93
US7283387B2Oct 16, 2007
Phase change random access memory device having variable drive voltage circuit
SAMSUNG ELECTRONICS CO LTD44 citations93
US6459652B1Oct 1, 2002
Semiconductor memory device having echo clock path
SAMSUNG ELECTRONICS CO LTD21 citations93
US7522449B2Apr 21, 2009
Phase change memory device and related programming method
SAMSUNG ELECTRONICS CO LTD35 citations92
US7486536B2Feb 3, 2009
Phase-changeable memory device and method of programming the same
SAMSUNG ELECTRONICS CO LTD31 citations92
US6594818B2Jul 15, 2003
Memory architecture permitting selection of storage density after fabrication of active circuitry
SAMSUNG ELECTRONICS CO LTD34 citations92
US6507224B1Jan 14, 2003
High speed input receiver for generating pulse signal
SAMSUNG ELECTRONICS CO LTD24 citations92
US7746688B2Jun 29, 2010
PRAM and method of firing memory cells
SAMSUNG ELECTRONICS CO LTD20 citations91
US6901014B2May 31, 2005
Circuits and methods for screening for defective memory cells in semiconductor memory devices
SAMSUNG ELECTRONICS CO LTD47 citations90
US7978539B2Jul 12, 2011
Semiconductor device having resistance based memory array, method of reading, and systems associated therewith
SAMSUNG ELECTRONICS CO LTD10 citations84
US7952956B2May 31, 2011
Variable resistance memory device and system
SAMSUNG ELECTRONICS CO LTD15 citations84
US7949928B2May 24, 2011
Semiconductor memory device and data error detection and correction method of the same
SAMSUNG ELECTRONICS CO LTD10 citations84
US7881145B2Feb 1, 2011
Semiconductor device and semiconductor system having the same
SAMSUNG ELECTRONICS CO LTD14 citations84
US7688620B2Mar 30, 2010
Nonvolatile memory device and related methods of operation
SAMSUNG ELECTRONICS CO LTD10 citations84
US7580295B2Aug 25, 2009
Semiconductor memory device and memory system including semiconductor memory device
SAMSUNG ELECTRONICS CO LTD8 citations84
US7548467B2Jun 16, 2009
Bias voltage generator and method generating bias voltage for semiconductor memory device
SAMSUNG ELECTRONICS CO LTD14 citations84
US7471553B2Dec 30, 2008
Phase change memory device and program method thereof
SAMSUNG ELECTRONICS CO LTD10 citations84
US7457152B2Nov 25, 2008
Non-volatile memory devices and systems including phase-change one-time-programmable (OTP) memory cells and related methods
SAMSUNG ELECTRONICS CO LTD12 citations84
US6933758B2Aug 23, 2005
Synchronous mirror delay circuit with adjustable locking range
SAMSUNG ELECTRONICS CO LTD14 citations84
US6617894B2Sep 9, 2003
Circuits and methods for generating internal clock signal of intermediate phase relative to external clock
SAMSUNG ELECTRONICS CO LTD16 citations84
US6583647B2Jun 24, 2003
Signal converting system having level converter for use in high speed semiconductor device and method therefor
SAMSUNG ELECTRONICS CO LTD13 citations84
US11003382B2May 11, 2021
Apparatus for outputting internal state of memory apparatus and memory system using the apparatus
SAMSUNG ELECTRONICS CO LTD7 citations83
US6785173B2Aug 31, 2004
Semiconductor memory device capable of performing high-frequency wafer test operation
SAMSUNG ELECTRONICS CO LTD13 citations82
US6166969ADec 26, 2000
Method and apparatus for a level shifter for use in a semiconductor memory device
SAMSUNG ELECTRONICS CO LTD17 citations81
US7920432B2Apr 5, 2011
Semiconductor device having resistance based memory array, method of reading, and systems associated therewith
SAMSUNG ELECTRONICS CO LTD6 citations74
US7894277B2Feb 22, 2011
Semiconductor device having resistance based memory array, method of reading and writing, and systems associated therewith
SAMSUNG ELECTRONICS CO LTD6 citations74
US7751232B2Jul 6, 2010
Method of testing PRAM device
SAMSUNG ELECTRONICS CO LTD7 citations74
US6834366B2Dec 21, 2004
Method of outputting internal information through test pin of semiconductor memory and output circuit thereof
SAMSUNG ELECTRONICS CO LTD10 citations74
US10644069B2May 5, 2020
Memory devices having crosspoint memory arrays therein with multi-level word line and bit line structures
SAMSUNG ELECTRONICS CO LTD6 citations73
US9952789B2Apr 24, 2018
Memory systems and electronic devices including nonvolatile memory modules
SAMSUNG ELECTRONICS CO LTD2 citations73
US9799399B2Oct 24, 2017
Nonvolatile memory devices including controller for operating nonvolatile memory cell array layer in memory chip in one of memory mode and storage mode
SAMSUNG ELECTRONICS CO LTD4 citations73
CHO WOO-YEONG
4 patentsUS8159867B2Apr 17, 2012
Phase change memory devices and systems, and related programming methods
CHO WOO-YEONG49 citations97
US8116127B2Feb 14, 2012
Phase change memory devices and systems, and related programming methods
CHO WOO-YEONG24 citations92
US8116117B2Feb 14, 2012
Method of driving multi-level variable resistive memory device and multi-level variable resistive memory device
CHO WOO-YEONG22 citations92
US8143653B2Mar 27, 2012
Variable resistance memory device and system thereof
CHO WOO-YEONG14 citations83
LG CHEMICAL LTD
2 patentsBAE JUN-SOO
1 patentCHOI BYUNG-GIL
1 patentHYUNDAI ELECTRONICS IND
1 patentLEE KWANG JIN
1 patentLEE KWANG-JIN
1 patentKOLON INC
1 patentSAMSUNG ELECTRONCIS CO LTD
1 patentLEE YONG-JUN
1 patentShowing the top 50 of 141 patents by PatentIndex Score.