Inventor
CHOI BYUNG GIL
KR73 patents
⚠️ This page may combine multiple inventors who share the name “CHOI BYUNG GIL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
40 patentsUS7808815B2Oct 5, 2010
Variable resistance memory device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD72 citations98
US7643344B2Jan 5, 2010
Variable resistive memory
SAMSUNG ELECTRONICS CO LTD53 citations98
US7110286B2Sep 19, 2006
Phase-change memory device and method of writing a phase-change memory device
SAMSUNG ELECTRONICS CO LTD55 citations96
US6885602B2Apr 26, 2005
Programming method of controlling the amount of write current applied to phase change memory device and write driver circuit therefor
SAMSUNG ELECTRONICS CO LTD64 citations95
US7633788B2Dec 15, 2009
Variable resistive memory wordline switch
SAMSUNG ELECTRONICS CO LTD16 citations93
US7502251B2Mar 10, 2009
Phase-change memory device and method of writing a phase-change memory device
SAMSUNG ELECTRONICS CO LTD23 citations93
US7450415B2Nov 11, 2008
Phase-change memory device
SAMSUNG ELECTRONICS CO LTD24 citations93
US7315469B2Jan 1, 2008
Control of set/reset pulse in response to peripheral temperature in PRAM device
SAMSUNG ELECTRONICS CO LTD21 citations93
US7274586B2Sep 25, 2007
Method for programming phase-change memory array to set state and circuit of a phase-change memory device
SAMSUNG ELECTRONICS CO LTD26 citations93
US7242605B2Jul 10, 2007
Phase-change memory device and method that maintains the resistance of a phase-change material in a reset state within a constant resistance range
SAMSUNG ELECTRONICS CO LTD26 citations93
US7227776B2Jun 5, 2007
Phase change random access memory (PRAM) device
SAMSUNG ELECTRONICS CO LTD24 citations93
US7447092B2Nov 4, 2008
Write driver circuit for controlling a write current applied to a phase change memory based on an ambient temperature
SAMSUNG ELECTRONICS CO LTD15 citations92
US7391644B2Jun 24, 2008
Phase-changeable memory device and read method thereof
SAMSUNG ELECTRONICS CO LTD29 citations92
US8040714B2Oct 18, 2011
Multilevel nonvolatile memory device using variable resistance
SAMSUNG ELECTRONICS CO LTD7 citations84
US8023320B2Sep 20, 2011
Resistance-change random access memory device including memory cells connected to discharge elements
SAMSUNG ELECTRONICS CO LTD10 citations84
US7978539B2Jul 12, 2011
Semiconductor device having resistance based memory array, method of reading, and systems associated therewith
SAMSUNG ELECTRONICS CO LTD10 citations84
US7570530B2Aug 4, 2009
Nonvolatile memory device using variable resistive element
SAMSUNG ELECTRONICS CO LTD8 citations84
US7511993B2Mar 31, 2009
Phase change memory device and related programming method
SAMSUNG ELECTRONICS CO LTD9 citations84
US7499316B2Mar 3, 2009
Phase change memory devices and program methods
SAMSUNG ELECTRONICS CO LTD9 citations84
US7474556B2Jan 6, 2009
Phase-change random access memory device
SAMSUNG ELECTRONICS CO LTD10 citations84
US7463511B2Dec 9, 2008
Phase change memory device using multiprogramming method
SAMSUNG ELECTRONICS CO LTD9 citations84
US7405965B2Jul 29, 2008
Phase change memory device
SAMSUNG ELECTRONICS CO LTD17 citations84
US7214963B2May 8, 2007
3-D column select circuit layout in semiconductor memory devices
SAMSUNG ELECTRONICS CO LTD12 citations84
US7075848B2Jul 11, 2006
Redundancy circuit in semiconductor memory device having a multiblock structure
SAMSUNG ELECTRONICS CO LTD12 citations84
US7453722B2Nov 18, 2008
Phase change memory device and memory cell array thereof
SAMSUNG ELECTRONICS CO LTD9 citations83
US7830699B2Nov 9, 2010
Resistance variable memory device reducing word line voltage
SAMSUNG ELECTRONICS CO LTD5 citations74
US7796425B2Sep 14, 2010
Control of set/reset pulse in response to peripheral temperature in PRAM device
SAMSUNG ELECTRONICS CO LTD6 citations74
US7613037B2Nov 3, 2009
Phase-change memory device and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD7 citations74
US7835199B2Nov 16, 2010
Nonvolatile memory using resistance material
SAMSUNG ELECTRONICS CO LTD7 citations73
US7573766B2Aug 11, 2009
Phase change random access memory and method of testing the same
SAMSUNG ELECTRONICS CO LTD7 citations72
US8027192B2Sep 27, 2011
Resistive memory devices using assymetrical bitline charging and discharging
SAMSUNG ELECTRONICS CO LTD2 citations63
US8023319B2Sep 20, 2011
Phase change memory
SAMSUNG ELECTRONICS CO LTD4 citations63
US8009476B2Aug 30, 2011
Semiconductor memory device using variable resistor
SAMSUNG ELECTRONICS CO LTD3 citations63
US8004925B2Aug 23, 2011
Variable resistive memory
SAMSUNG ELECTRONICS CO LTD3 citations63
US7974118B2Jul 5, 2011
Resistance variable memory device reducing word line voltage
SAMSUNG ELECTRONICS CO LTD3 citations63
US7974116B2Jul 5, 2011
Variable resistance memory device
SAMSUNG ELECTRONICS CO LTD3 citations63
US7961508B2Jun 14, 2011
Phase-change random access memory
SAMSUNG ELECTRONICS CO LTD3 citations63
US7929337B2Apr 19, 2011
Phase-change random access memories capable of suppressing coupling noise during read-while-write operation
SAMSUNG ELECTRONICS CO LTD5 citations63
US7885098B2Feb 8, 2011
Non-volatile phase-change memory device and method of reading the same
SAMSUNG ELECTRONICS CO LTD6 citations63
US7821865B2Oct 26, 2010
Nonvolatile memory device using variable resistive elements
SAMSUNG ELECTRONICS CO LTD6 citations63
CHOI BYUNG-GIL
7 patentsUS8077496B2Dec 13, 2011
Nonvolatile memory device and method of driving the same
CHOI BYUNG-GIL47 citations94
US8139432B2Mar 20, 2012
Variable resistance memory device and system thereof
CHOI BYUNG-GIL21 citations92
US8081501B2Dec 20, 2011
Multi-level nonvolatile memory device using variable resistive element
CHOI BYUNG-GIL26 citations92
US8213254B2Jul 3, 2012
Nonvolatile memory device with temperature controlled column selection signal levels
CHOI BYUNG-GIL6 citations73
US8264905B2Sep 11, 2012
Nonvolatile memory device using variable resistive element
CHOI BYUNG-GIL2 citations63
US8243508B2Aug 14, 2012
Resistive memory devices using assymetrical bitline charging and discharging
CHOI BYUNG-GIL2 citations63
US8228720B2Jul 24, 2012
Nonvolatile memory devices including variable resistive elements
CHOI BYUNG-GIL2 citations63
CHUNG WON-RYUL
1 patentCHOI BYUNG GIL
1 patentKIM HYE-JIN
1 patentShowing the top 50 of 73 patents by PatentIndex Score.