P

Inventor

CHOI BYUNG GIL

KR73 patents
⚠️ This page may combine multiple inventors who share the name “CHOI BYUNG GIL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

40 patents
US7808815B2Oct 5, 2010

Variable resistance memory device and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD72 citations98
US7643344B2Jan 5, 2010

Variable resistive memory

SAMSUNG ELECTRONICS CO LTD53 citations98
US7110286B2Sep 19, 2006

Phase-change memory device and method of writing a phase-change memory device

SAMSUNG ELECTRONICS CO LTD55 citations96
US6885602B2Apr 26, 2005

Programming method of controlling the amount of write current applied to phase change memory device and write driver circuit therefor

SAMSUNG ELECTRONICS CO LTD64 citations95
US7633788B2Dec 15, 2009

Variable resistive memory wordline switch

SAMSUNG ELECTRONICS CO LTD16 citations93
US7502251B2Mar 10, 2009

Phase-change memory device and method of writing a phase-change memory device

SAMSUNG ELECTRONICS CO LTD23 citations93
US7450415B2Nov 11, 2008

Phase-change memory device

SAMSUNG ELECTRONICS CO LTD24 citations93
US7315469B2Jan 1, 2008

Control of set/reset pulse in response to peripheral temperature in PRAM device

SAMSUNG ELECTRONICS CO LTD21 citations93
US7274586B2Sep 25, 2007

Method for programming phase-change memory array to set state and circuit of a phase-change memory device

SAMSUNG ELECTRONICS CO LTD26 citations93
US7242605B2Jul 10, 2007

Phase-change memory device and method that maintains the resistance of a phase-change material in a reset state within a constant resistance range

SAMSUNG ELECTRONICS CO LTD26 citations93
US7227776B2Jun 5, 2007

Phase change random access memory (PRAM) device

SAMSUNG ELECTRONICS CO LTD24 citations93
US7447092B2Nov 4, 2008

Write driver circuit for controlling a write current applied to a phase change memory based on an ambient temperature

SAMSUNG ELECTRONICS CO LTD15 citations92
US7391644B2Jun 24, 2008

Phase-changeable memory device and read method thereof

SAMSUNG ELECTRONICS CO LTD29 citations92
US8040714B2Oct 18, 2011

Multilevel nonvolatile memory device using variable resistance

SAMSUNG ELECTRONICS CO LTD7 citations84
US8023320B2Sep 20, 2011

Resistance-change random access memory device including memory cells connected to discharge elements

SAMSUNG ELECTRONICS CO LTD10 citations84
US7978539B2Jul 12, 2011

Semiconductor device having resistance based memory array, method of reading, and systems associated therewith

SAMSUNG ELECTRONICS CO LTD10 citations84
US7570530B2Aug 4, 2009

Nonvolatile memory device using variable resistive element

SAMSUNG ELECTRONICS CO LTD8 citations84
US7511993B2Mar 31, 2009

Phase change memory device and related programming method

SAMSUNG ELECTRONICS CO LTD9 citations84
US7499316B2Mar 3, 2009

Phase change memory devices and program methods

SAMSUNG ELECTRONICS CO LTD9 citations84
US7474556B2Jan 6, 2009

Phase-change random access memory device

SAMSUNG ELECTRONICS CO LTD10 citations84
US7463511B2Dec 9, 2008

Phase change memory device using multiprogramming method

SAMSUNG ELECTRONICS CO LTD9 citations84
US7405965B2Jul 29, 2008

Phase change memory device

SAMSUNG ELECTRONICS CO LTD17 citations84
US7214963B2May 8, 2007

3-D column select circuit layout in semiconductor memory devices

SAMSUNG ELECTRONICS CO LTD12 citations84
US7075848B2Jul 11, 2006

Redundancy circuit in semiconductor memory device having a multiblock structure

SAMSUNG ELECTRONICS CO LTD12 citations84
US7453722B2Nov 18, 2008

Phase change memory device and memory cell array thereof

SAMSUNG ELECTRONICS CO LTD9 citations83
US7830699B2Nov 9, 2010

Resistance variable memory device reducing word line voltage

SAMSUNG ELECTRONICS CO LTD5 citations74
US7796425B2Sep 14, 2010

Control of set/reset pulse in response to peripheral temperature in PRAM device

SAMSUNG ELECTRONICS CO LTD6 citations74
US7613037B2Nov 3, 2009

Phase-change memory device and method of fabricating the same

SAMSUNG ELECTRONICS CO LTD7 citations74
US7835199B2Nov 16, 2010

Nonvolatile memory using resistance material

SAMSUNG ELECTRONICS CO LTD7 citations73
US7573766B2Aug 11, 2009

Phase change random access memory and method of testing the same

SAMSUNG ELECTRONICS CO LTD7 citations72
US8027192B2Sep 27, 2011

Resistive memory devices using assymetrical bitline charging and discharging

SAMSUNG ELECTRONICS CO LTD2 citations63
US8023319B2Sep 20, 2011

Phase change memory

SAMSUNG ELECTRONICS CO LTD4 citations63
US8009476B2Aug 30, 2011

Semiconductor memory device using variable resistor

SAMSUNG ELECTRONICS CO LTD3 citations63
US8004925B2Aug 23, 2011

Variable resistive memory

SAMSUNG ELECTRONICS CO LTD3 citations63
US7974118B2Jul 5, 2011

Resistance variable memory device reducing word line voltage

SAMSUNG ELECTRONICS CO LTD3 citations63
US7974116B2Jul 5, 2011

Variable resistance memory device

SAMSUNG ELECTRONICS CO LTD3 citations63
US7961508B2Jun 14, 2011

Phase-change random access memory

SAMSUNG ELECTRONICS CO LTD3 citations63
US7929337B2Apr 19, 2011

Phase-change random access memories capable of suppressing coupling noise during read-while-write operation

SAMSUNG ELECTRONICS CO LTD5 citations63
US7885098B2Feb 8, 2011

Non-volatile phase-change memory device and method of reading the same

SAMSUNG ELECTRONICS CO LTD6 citations63
US7821865B2Oct 26, 2010

Nonvolatile memory device using variable resistive elements

SAMSUNG ELECTRONICS CO LTD6 citations63

CHOI BYUNG-GIL

7 patents

CHUNG WON-RYUL

1 patent

CHOI BYUNG GIL

1 patent

KIM HYE-JIN

1 patent

Showing the top 50 of 73 patents by PatentIndex Score.