P

Inventor

HANAI HISAYOSHI

JP5 patents
⚠️ This page may combine multiple inventors who share the name “HANAI HISAYOSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MITSUBISHI ELECTRIC CORP

3 patents
US6492923B1Dec 10, 2002

Test system and testing method using memory tester

MITSUBISHI ELECTRIC CORP75 citations90
US6661248B2Dec 9, 2003

Tester for semiconductor integrated circuits

MITSUBISHI ELECTRIC CORP14 citations83
US6522126B1Feb 18, 2003

Semiconductor tester, and method of testing semiconductor using the same

MITSUBISHI ELECTRIC CORP3 citations59

RENESAS TECH CORP

1 patent
US7058865B2Jun 6, 2006

Apparatus for testing semiconductor integrated circuit

RENESAS TECH CORP60 citations95

RYODEN SEMICONDUCTOR SYST ENG

1 patent
US6934648B2Aug 23, 2005

Jitter measurement circuit for measuring jitter of measurement target signal on the basis of sampling data string obtained by using ideal cyclic signal

RYODEN SEMICONDUCTOR SYST ENG27 citations91